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£ 19.50
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Add to basketHardcover. 2nd ed. XVI, 408 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05638 9780387400921 Sprache: Englisch Gewicht in Gramm: 550.
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£ 19.65
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Add to basketHardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.
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£ 8.64
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Add to basketGebundene Ausgabe. Condition: Gut. 96 Seiten, bebildert. Einband leicht berieben, ansonsten gut erhalten. ISBN: 9783000084423 Sprache: Deutsch Gewicht in Gramm: 550.
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hardcover. Condition: Very Good. High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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hardcover. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 45.62
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£ 38.86
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Add to basketHardcover. Condition: Very Good. 2. Auflage. Unread, some shelfwear. Immediately dispatched from Germany.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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High-Resolution X-Ray Scattering
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
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£ 70.71
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£ 64
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 62.73
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Add to basketHardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Published by Springer New York, Springer US, 2011
ISBN 10: 1441923071 ISBN 13: 9781441923073
Language: English
£ 90.78
Convert currency£ 12.22 shipping from Germany to United KingdomQuantity: 1 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
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Ein fein Bergmannig Porcelan: Abbilder vom Bergbau in "Weissem Gold" (Veröffentlichungen aus dem Deutschen Bergbau-Museum)
Published by Deutsches Bergbau-Museum, 1999
ISBN 10: 3921533643 ISBN 13: 9783921533642
Language: German
£ 17.09
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Add to basketHardcover. Condition: Sehr gut. 28,19 x 22,86 x 2,54 Gebundene Ausgabe, SEHR GUTES EXEMPLAR--- Für Ihre Zufriedenheit versenden wir mit DHL und ausschließlich mit Trackingcode für eine sichere Sendungsverfolgung! Weitere Angebote unter antiquariat-kastanienhof , 365 Seiten. nein.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 114.13
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High-Resolution X-Ray Scattering
Published by Springer New York, Springer US Dez 2011, 2011
ISBN 10: 1441923071 ISBN 13: 9781441923073
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
£ 86.60
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Add to basketTaschenbuch. Condition: Neu. Neuware -During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 428 pp. Englisch.
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£ 113.06
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Add to basketCondition: New. pp. 428.
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£ 75.86
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Add to basketTaschenbuch. Condition: Neu. High-Resolution X-Ray Scattering | From Thin Films to Lateral Nanostructures | Ullrich Pietsch (u. a.) | Taschenbuch | xvi | Englisch | 2011 | Springer US | EAN 9781441923073 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. Like New. book.
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Paperback. Condition: Brand New. 2nd edition. 410 pages. 9.00x6.00x1.00 inches. In Stock.
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£ 99.88
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Add to baskethardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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£ 82.39
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£ 146.76
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£ 114.61
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High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
Hardcover. Condition: Like New. Like New. Ships from Multiple Locations. book.
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High-Resolution X-Ray Scattering
Published by Springer Nature B.V., 2012
ISBN 10: 1475740514 ISBN 13: 9781475740516
Language: English
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
£ 46.23
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Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
