High-resolution x-ray scattering. From thin films and multilayers.

Holy, Vaclav; Pietsch, Ullrich; Baumbach, Tilo

ISBN 10: 354062029X / ISBN 13: 9783540620297

Published by Berlin, Springer, 1999

About this Item

Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.

Seller Inventory # 2488639

Bibliographic Details

• Title: High-resolution x-ray scattering. From thin films and multilayers.
• Publisher: Berlin, Springer
• Publication Date: 1999
• Language: English
• ISBN 10: 354062029X
• ISBN 13: 9783540620297
• Binding: Hardcover
• Weight: 1050 grams
• Seller catalogs:
  • SA MATHEMATIK

About this title

Synopsis

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.