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X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149 (Springer Tracts in Modern Physics) - Hardcover
Synopsis
This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.
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High-resolution x-ray scattering. From thin films and multilayers.
Seller: Antiquariat Bookfarm, Löbnitz, Germany
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Hardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050. Seller Inventory # 2488639
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High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
Seller: Mispah books, Redhill, SURRE, United Kingdom
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Hardcover. Condition: Like New. Like New. book. Seller Inventory # ERICA758354062029X5
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