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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Les systèmes mécatroniques embarqués: Tome 2, Analyse des causes de défaillances, modélisation, stimulation et optimisation
Language: English
Published by Hermes Science Publishing Ltd, 2015
ISBN 10: 1784050598 ISBN 13: 9781784050597
£ 44 10% off£ 39.60
£ 14.39 shipping
Ships from France to U.S.A.Quantity: 1 available
Add to basketSoftcover. Condition: Très bon. Ancien livre de bibliothèque avec équipements. Edition 2015. Tome 2. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Edition 2015. Volume 2. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. pp. 280.
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Condition: New. pp. 280.
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Embedded Mechatronic Systems, Volume 2
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Condition: New.
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Condition: New. pp. 280.
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Embedded Mechatronic Systems : Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Condition: New.
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Embedded Mechatronic Systems, Volume 2
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Condition: New.
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Embedded Mechatronic Systems, Volume 2: Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press Ltd - Elsevier Inc, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 85.46
£ 16.55 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. New copy - Usually dispatched within 4 working days.
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Embedded Mechatronic Systems: Analysis of Failures, Predictive Reliability
Language: English
Published by ISTE Press Ltd - Elsevier Inc
ISBN 10: 1785481894 ISBN 13: 9781785481895
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 85.46
£ 16.89 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. New copy - Usually dispatched within 4 working days.
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Embedded Mechatronic Systems, Volume 2
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Condition: New.
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Condition: As New. Unread book in perfect condition.
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Embedded Mechatronic Systems : Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Condition: As New. Unread book in perfect condition.
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Embedded Mechatronic Systems : Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Embedded Mechatronic Systems : Analysis of Failures, Predictive Reliability
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Embedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 95.02
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Embedded Mechatronic Systems: Analysis of Failures, Predictive Reliability
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 95.02
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Embedded Mechatronic Systems, Volume 2 : Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press Ltd - Elsevier Inc, 2015
ISBN 10: 1785480146 ISBN 13: 9781785480140
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 272 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Embedded Mechatronic Systems : Analysis of Failures, Predictive Reliability
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 106.69
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Embedded Mechatronic Systems : Analysis of Failures, Modeling, Simulation and Optimization
Language: English
Published by ISTE Press - Elsevier, 2020
ISBN 10: 1785481908 ISBN 13: 9781785481901
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 106.64
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: As New. Unread book in perfect condition.
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Nanometer-scale Defect Detection Using Polarized Light (Hardcover)
Language: English
Published by ISTE Ltd and John Wiley & Sons Inc, London, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Hardcover. Condition: new. Hardcover. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
