Paul Thadikaran (19 results)

Author
Refine with Advanced Search

Refine your search

  • Books (19)

to

Custom price range (£)

to

    • Language: English

      Published by Springer, 1997

      0792399455 / 9780792399452

      • Hardcover
      • First Edition

      Seller: Yes Books, portland, ME, U.S.A.Yes Books

      5-star seller
      Contact seller

      Condition: Used - Near fine

      £ 76.02

      £ 4.54 shipping 
      Ships within U.S.A.

      Quantity: 1 available

      Hardcover. Condition: Near Fine. No Dust Jacket. 1st Edition. Spine lightly sunned. Otherwise copy is clean and unmarked in near fine condition. 322 pages.

    • Language: English

      Published by Springer, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

      5-star seller
      Contact seller

      Condition: Used - As new

      £ 101.76

      £ 1.95 shipping 
      Ships within U.S.A.

      Quantity: Over 20 available

      Condition: As New. Unread book in perfect condition.

    • Language: English

      Published by Springer, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover

      Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

      5-star seller
      Contact seller

      Condition: New

      £ 96.88

      £ 11.29 shipping 
      Ships from United Kingdom to U.S.A.

      Quantity: Over 20 available

      Condition: New. In.

    • Language: English

      Published by Springer, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

      5-star seller
      Contact seller

      Condition: New

      £ 96.88

      £ 11.29 shipping 
      Ships from United Kingdom to U.S.A.

      Quantity: Over 20 available

      Condition: New. In.

    • Language: English

      Published by Springer, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

      5-star seller
      Contact seller

      Condition: New

      £ 96.87

      £ 15.00 shipping 
      Ships from United Kingdom to U.S.A.

      Quantity: Over 20 available

      Condition: New.

    • Language: English

      Published by Springer, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

      5-star seller
      Contact seller

      Condition: New

      £ 114.15

      £ 1.95 shipping 
      Ships within U.S.A.

      Quantity: Over 20 available

      Condition: New.

    • Language: English

      Published by Springer, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

      5-star seller
      Contact seller

      Condition: Used - As new

      £ 105.08

      £ 15.00 shipping 
      Ships from United Kingdom to U.S.A.

      Quantity: Over 20 available

      Condition: As New. Unread book in perfect condition.

    • Language: English

      Published by Springer, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover

      Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

      4-star seller
      Contact seller

      Condition: New

      £ 124.60

      £ 2.94 shipping 
      Ships within U.S.A.

      Quantity: 4 available

      Condition: New. pp. 348.

    • Language: English

      Published by Kluwer Academic Publishers, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.

      5-star seller
      Contact seller

      Condition: New

      £ 120.10

      £ 8.16 shipping 
      Ships from Ireland to U.S.A.

      Quantity: 15 available

      Condition: New. Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area. Series: Frontiers in Electronic Testing. Num Pages: 342 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 20. Weight in Grams: 664. . 1997. Hardback. . . . .

    • Language: English

      Published by Kluwer Academic Publishers, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore

      5-star seller
      Contact seller

      Condition: New

      £ 144.77

      £ 7.75 shipping 
      Ships within U.S.A.

      Quantity: 15 available

      Condition: New. Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area. Series: Frontiers in Electronic Testing. Num Pages: 342 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 20. Weight in Grams: 664. . 1997. Hardback. . . . . Books ship from the US and Ireland.

    • Language: English

      Published by Springer US, 1997

      0792399455 / 9780792399452

      • Hardcover

      Seller: Buchpark, Trebbin, GermanyBuchpark

      5-star seller
      Contact seller

      Condition: Used - Very good

      £ 73.03

      £ 90.16 shipping 
      Ships from Germany to U.S.A.

      Quantity: 2 available

      Condition: Gut. Zustand: Gut | Seiten: 348 | Sprache: Englisch | Produktart: Bücher | Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

    • Language: English

      Published by Springer, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover
      • Print on Demand

      Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

      5-star seller
      Contact seller

      Condition: New

      £ 76.27

      £ 5.84 shipping 
      Ships from Italy to U.S.A.

      Quantity: Over 20 available

      Condition: new. Questo è un articolo print on demand.

    • Language: English

      Published by Springer US Jun 1997, 1997

      0792399455 / 9780792399452

      • Hardcover
      • Print on Demand

      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

      5-star seller
      Contact seller

      Condition: New

      £ 94.62

      £ 19.75 shipping 
      Ships from Germany to U.S.A.

      Quantity: 2 available

      Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area. 348 pp. Englisch.

    • Language: English

      Published by Springer US Okt 2012, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover
      • Print on Demand

      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

      5-star seller
      Contact seller

      Condition: New

      £ 94.62

      £ 19.75 shipping 
      Ships from Germany to U.S.A.

      Quantity: 2 available

      Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area. 348 pp. Englisch.

    • Language: English

      Published by Springer US, 1997

      0792399455 / 9780792399452

      • Hardcover
      • Print on Demand

      Seller: moluna, Greven, Germanymoluna

      5-star seller
      Contact seller

      Condition: New

      £ 81.60

      £ 42.06 shipping 
      Ships from Germany to U.S.A.

      Quantity: Over 20 available

      Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more i.

    • Language: English

      Published by Springer US, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover
      • Print on Demand

      Seller: moluna, Greven, Germanymoluna

      5-star seller
      Contact seller

      Condition: New

      £ 81.60

      £ 42.06 shipping 
      Ships from Germany to U.S.A.

      Quantity: Over 20 available

      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more i.

    • Language: English

      Published by Springer, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover
      • Print on Demand

      Seller: Majestic Books, Hounslow, United KingdomMajestic Books

      4-star seller
      Contact seller

      Condition: New

      £ 127.02

      £ 6.50 shipping 
      Ships from United Kingdom to U.S.A.

      Quantity: 4 available

      Condition: New. Print on Demand pp. 348 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

    • Language: English

      Published by Springer, 2012

      1461378125 / 9781461378129

      Series: Book 25 of 40 - Frontiers in Electronic Testing

      • Softcover
      • Print on Demand

      Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

      4-star seller
      Contact seller

      Condition: New

      £ 134.34

      £ 8.54 shipping 
      Ships from Germany to U.S.A.

      Quantity: 4 available

      Condition: New. PRINT ON DEMAND pp. 348.

    • Language: English

      Published by Springer US, Springer US Jun 1997, 1997

      0792399455 / 9780792399452

      • Hardcover
      • Print on Demand

      Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

      5-star seller
      Contact seller

      Condition: New

      £ 94.62

      £ 51.52 shipping 
      Ships from Germany to U.S.A.

      Quantity: 1 available

      Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson.This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 348 pp. Englisch.