Paul Predecki (87 results)
Advances in X-Ray Analysis, Vol. 29
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & John Faber, Jr., & Ron Jenkins, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.
Published by J Applied Physics 1970
- Softcover
- Periodical
Seller: Larry W Price Books, Portland, OR, U.S.A.Larry W Price Books
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Pamphlet. Condition: Very Good. Vol 41, No 11, pp. 4342-4346, Illus, 4to, Extracted from orig vol, begins with title page, trimmed & stapled, thus is like a pamphlet, else VG.
Published by J Applied Physics 1966
- Softcover
- Periodical
Seller: Larry W Price Books, Portland, OR, U.S.A.Larry W Price Books
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Pamphlet. Condition: Very Good. Vol 37, No 11, pp. 4053-4059, Illus, 4to, Extracted from orig vol, begins with title page, trimmed & stapled, thus is like a pamphlet else VG.
Advances in X-Ray Analysis, Vol. 31
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & Ron Jenkins & John V. Gilfrich,, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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£ 19.51
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.
Advances in X-Ray Analysis, Vol. 30
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & Ron Jenkins & John V. Gilfrich,, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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£ 19.51
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.
- Hardcover
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
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£ 19.55
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Hardcover. Condition: Very Good. Hardcover; Volume 32 only; proceedings of the 37th annual conference on Applications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, Colorado; light fading and shelf wear to exterior; former owner's stamping on front endpaper; a few small spots at top page edge; in very good condi…tion with clean text, firm binding. Dust jacket shows light scuffing and shelf wear.
- Hardcover
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
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Hardcover. Condition: Very Good. Hardcover; Volume 29 only; proceedings of the 34th annual conference on Applications of X-Ray Analysis, held August 5-9, 1985, in Snowmass, Colorado; light fading and shelf wear to exterior; light stain at top page corners; fade spots to endpapers; in very good condition with clean text, firm bin…ding. Dust jacket shows scuffing, light soiling, and a few small edge tears.
Advances in X-Ray Analysis, Vol. 27
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden & John C. Russ & Jerome B. Cohen, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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£ 57.32
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
- Hardcover
Seller: SMASS Sellers, IRVING, TX, U.S.A.SMASS Sellers
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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- Softcover
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- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 1334 1st Edition.
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Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. 1334.
- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. pp. 1334.
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Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 412 Index.
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 648.
- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
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£ 84.90
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Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, June 29 (SALE item)* 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is r…esponsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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- Softcover
- International Edition
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be print…ed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 28 | Paul K. Predecki (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2011 | Springer US | EAN 9781461294993 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbiete…r: preigu.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 932.
- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray… fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD I…nstrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
