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Language: English
Published by Kluwer Academic Publishers, Norwell, Massachusetts, U.S.A., 1995
ISBN 10: 0792395808 ISBN 13: 9780792395805
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
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Language: English
Published by Kluwer Academic Publishers, Norwell, Massachusetts, U.S.A., 1989
ISBN 10: 0898383021 ISBN 13: 9780898383027
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
First Edition
hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. First Edition. White hardcover with black lettering on spine and upper board and contents in very good clean condition, showing minimal signs of wear. Previous owner's name on FEP. Profusely illustrated by diagrams and tables. No dust jacket. T. Used.
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Condition: New.
Published by Kluwer Academic Publishers 1995, 1995
Seller: Wonderland Books, Berkeley, CA, U.S.A.
ed. hardback very good condition with a pen name on the free front end page- no dust jacket.
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Language: English
Published by LIGHTNING SOURCE INC, 2015
ISBN 10: 0997082003 ISBN 13: 9780997082005
Seller: moluna, Greven, Germany
Condition: New. Über den AutorDavid Overhauser, Ph.D., began working with startups in 1980. He has been involved in over 20 startups in a variety of roles over 35 years, including engineer, Vice President, Founder, Board Member, investor, co.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
£ 94.30
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Condition: Gut. Zustand: Gut | Seiten: 292 | Sprache: Englisch | Produktart: Bücher | Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.
Condition: New. pp. 224.
Condition: New. pp. 224.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Language: English
Published by Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10: 1461359821 ISBN 13: 9781461359821
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Paperback. Condition: new. Paperback. Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques. Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Seller: Mispah books, Redhill, SURRE, United Kingdom
Hardcover. Condition: Like New. Like New. book.
Seller: Mispah books, Redhill, SURRE, United Kingdom
Paperback. Condition: Like New. Like New. book.
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Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. pp. 294 Index.
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. pp. 292 Index.
Language: English
Published by Springer US, Springer New York, 2012
ISBN 10: 1461359821 ISBN 13: 9781461359821
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.
Language: English
Published by Springer US, Springer US, 1995
ISBN 10: 0792395808 ISBN 13: 9780792395805
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.
Seller: Mispah books, Redhill, SURRE, United Kingdom
Hardcover. Condition: Like New. Like New. book.