Nikulin M S (138 results)

hardcover. Condition: Very Good. Most items will be dispatched the same or the next working day. A copy that has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.

Trade Paperback. Condition: Good. No Dust Jacket. First Edition. An ex-library copy of this tall-format paperback. The usual ex-libris markings. The binding is sound, the text is clean/unmarked, and there is little cover wear. Book.

Condition: Very Good. Picture Shown is For Illustration Purposes Only, Please See Below For Further DetailsCONDITION ? LIKE NEW ? HARDBACK - dent to corner/edges of boards, shipped from the UK.

Hardcover. Condition: Good. No Dust Jacket. First Edition. An ex-library copy in original pictorial hard covers of this 507-page volume. The usual ex-libris markings. The binding is sound, the text is clean/unmarked, and there is little cover wear. No dust jacket, apparently as issued. Book.

hardcover. Condition: As New. Birkhaeuser; Boston, 2004. Hardcover. A Near Fine, binding firm, interior and extremities tidy, trace handling marks, mild shelf wear, trace waving to pages along page edges, without Dust wrapper. A nice, clean and unmarked copy. 8vo[octavo or approx. 6 x 9 inches]. 555pp., indexed. We pack securely and ship daily with delivery confirmation on every book. The picture on the listing page is of the actual book for sale. Additional Scan(s) are available for any item, please inquire.Please note: Oversized books/sets MAY require additional postage then what is quoted for 2.2lb book. …

Hardcover. Condition: Very Good+. Dust Jacket Condition: No Dust Jacket As Issued. Text clean and tight; no dust jacket; 7.87 X 5.43 X 0.87 inches; 480 pages.

Condition: Good. 1st Edition. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.…

Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Condition: New. Editor(s): Limnios, Nikolaos; Nikulin, M. S. Series: Statistics for Industry and Technology. Num Pages: 539 pages, biography. BIC Classification: PBF; PBT; PBW; TGPQ. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 27. Weight in Grams: 1023. . 2012. Softcover reprint of the original 1st ed. 2000. paperback. . . . .…

Condition: New. pp. 592.

Condition: New. pp. 592 Illus.

Couverture rigide. Condition: Très bon. Ed. Birkhäuser. 2008, 553 pages. Volume relié. Format : 18,5 x 26. TBE intérieur. TBE extérieur.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condition: New. Editor(s): Limnios, Nikolaos; Nikulin, M. S. Series: Statistics for Industry and Technology. Num Pages: 539 pages, biography. BIC Classification: PBF; PBT; PBW; TGPQ. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 27. Weight in Grams: 1023. . 2012. Softcover reprint of the original 1st ed. 2000. paperback. . . . . Books ship from the US and Ireland.…

Condition: New. pp. 592.

Condition: New.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condition: New. pp. 600.

Condition: New.

Condition: New. pp. 600 Illus.

Condition: New.

Condition: New.

Condition: New. pp. 600.

Condition: New. 2009. Hardcover. . . . . .

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Statistical inferential methods are widely used in the study of various physical, biological, social, and other phenomena. Parametric estimation is one such method. Although there are many books which consider problems of statistical point estimation, this volume is the first to be devoted solely to the problem of unbiased estimation. It contains three chapters dealing, respectively, with the theory of point statistical estimation, techniques for constructing unbiased estimators, and applications of unbiased estimation theory. These chapters are followed by a comprehensive appendix which classifies and lists, in the form of tables, all known results relating to unbiased estimators of parameters for univariate distributions. About one thousand minimum variance unbiased estimators are listed. The volume also contains numerous examples and exercises. This volume will serve as a handbook on point unbiased estimation for researchers whose work involves statistics. It can also be recommended as a supplementary text for graduate students.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - William Q. Meeker has made pioneering and phenomenal contributions to the general areaofreliabilityand,inparticular,tothetopicsofdegradationandacceleratedtesting. Hisresearchpublicationsandthenumerouscitationshehasreceivedoverthepastthree decades provide an ample testimony to this fact. Statistical methods have become critical in analyzing reliability and survival data. Highly reliable products have necessitated the development of accelerated testing and degradation models and their analyses. This volume has been put together in order to (i) review some of the recent advances on accelerated testing and degradation, (ii) highlight some new results and discuss their applications, and (iii) suggest possible directions for future research in these topics. With these speci c goals in mind, many authors were invited to write a chapter for this volume. These authors are not only experts in lifetime data analysis, but also form a representative group from former students, colleagues, and other close professional associates of William Meeker. All contributions have been peer reviewed and organized into 26 chapters. For the convenience of readers, the volume has been divided into the following six parts: - Review, Tutorials, and Perspective - Shock Models - Degradation Models - Reliability Estimation and ALT - Survival Function Estimation - Competing Risk and Chaotic Systems Itneedstobeemphasizedherethatthisvolumeisnotaproceedings,butacarefully anddeliberatelyplannedvolumecomprisingchaptersconsistentwiththeeditorialgoals and purposes mentioned above. Our thanks go to all the authors who have contributed to this volume. Thanks are also due to Mrs. Debbie Iscoe for the excellent typesetting of the entire volume.SpecialthanksgotoMs.ReginaGorenshteynandMr.TomGrasso(Editor,Birkh auser, Boston) for their interest and support for this project. …

Condition: Sehr gut. Zustand: Sehr gut | Seiten: 592 | Sprache: Englisch | Produktart: Bücher | An outgrowth of the "International Conference on Statistical Models for Biomedical and Technical Systems," this book is comprised of contributions from renowned experts, demonstrating the significance of current research on theory, methods, and applications of the field. The contributions, which deal with the mathematical aspects of survival analysis and reliability as well as other topics, are a careful selection of invited and contributed chapters, reflecting recent developments in the following areas: applications in epidemiology; probabilistic and statistical models and methods in reliability; models and methods in survival analysis, longevity, aging, and degradation; accelerated life models; quality of life; new statistical challenges in genomics. The book will be useful to a broad interdisciplinary readership of researchers and practitioners in applied probability and statistics, industrial statistics, biomedicine, biostatistics, and engineering.…