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Nicolas Brodusch (12 results)
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Condition: As New. Unread book in perfect condition.
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 59.58
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Condition: New.
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Paperback. Condition: Brand New. 152 pages. 9.25x6.10x0.47 inches. In Stock.
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Taschenbuch. Condition: Neu. Field Emission Scanning Electron Microscopy | New Perspectives for Materials Characterization | Nicolas Brodusch (u. a.) | Taschenbuch | SpringerBriefs in Applied Sciences and Technology | xii | Englisch | 2017 | Springer | EAN 9789811044328 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
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Condition: new. Questo è un articolo print on demand.
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Field Emission Scanning Electron Microscopy
Language: English
Published by Springer Nature Singapore Okt 2017, 2017
ISBN 10: 9811044325 ISBN 13: 9789811044328
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage 152 pp. Englisch.
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Field Emission Scanning Electron Microscopy
Language: English
Published by Springer, Springer Okt 2017, 2017
ISBN 10: 9811044325 ISBN 13: 9789811044328
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltageSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 152 pp. Englisch.
