Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology)

Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald

ISBN 10: 9811044325 ISBN 13: 9789811044328
Published by Springer, 2017
Language: English
Condition: New Soft cover

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