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Hardback or Cased Book. Condition: New. The 1st International Conference on Computational Engineering and Intelligent Systems. Book.
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Transport in metal-oxide-semiconductor structures : mobile ions effects on the oxide properties. Engineering materials
Book 7 of 110: Engineering MaterialsLanguage: English
Published by Berlin ; Heidelberg : Springer, 2011
ISBN 10: 3642163033 ISBN 13: 9783642163036
Seller: Kepler-Buchversand Huong Bach, Weil der Stadt, Germany
Seller rating 5 out of 5 stars
Gr.-8°, gebundene Ausgabe. Condition: Sehr gut. XIII, 104 S. : graph. Darst. Gebraucht: sehr guter Zustand. Contents: Introduction / The MOS STructure / The MOS Oxide and its Defects / Review of Transport Mechanism in Thin Oxides / of MOS Devices / Experimental Techniques / Theoretical Approaches of Mobile Ions Density Distribution Determination / Theoretical Model of Mobile Ions Distribution and Ionic Current in the MOS Oxide / Index. Sprache: Englisch Gewicht in Gramm: 315.
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Condition: As New. Unread book in perfect condition.
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Hardback or Cased Book. Condition: New. The 2nd International Conference on Computational Engineering and Intelligent Systems. Book.
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Hardback. Condition: New.
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Condition: As New. Unread book in perfect condition.
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The 1st International Conference on Computational Engineering and Intelligent Systems
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 42.82
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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The 1st International Conference On Computational Engineering And Intelligent Systems
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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The 1st International Conference on Computational Engineering and Intelligent Systems
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New.
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The 1st International Conference On Computational Engineering And Intelligent Systems
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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The 2nd International Conference on Computational Engineering and Intelligent Systems
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.44
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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The 2nd International Conference on Computational Engineering and Intelligent Systems
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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The 2nd International Conference on Computational Engineering and Intelligent Systems
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Hardback. Condition: New.
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Condition: As New. Unread book in perfect condition.
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Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties (Engineering Materials)
Book 7 of 110: Engineering MaterialsSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 95.42
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Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties (Engineering Materials)
Book 7 of 110: Engineering MaterialsSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | This book focuses on the importance of mobile ions presented in oxide structures, what significantly affects the metal-oxide-semiconductor (MOS) properties. The reading starts with the definition of the MOS structure, its various aspects and different types of charges presented in their structure. A review on ionic transport mechanisms and techniques for measuring the mobile ions concentration in the oxides is given, special attention being attempted to the Charge Pumping (CP) technique associated with the Bias Thermal Stress (BTS) method. Theoretical approaches to determine the density of mobile ions as well as their distribution along the oxide thickness are also discussed. The content varies from general to very specific examples, helping the reader to learn more about transport in MOS structures.
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Condition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | This book focuses on the importance of mobile ions presented in oxide structures, what significantly affects the metal-oxide-semiconductor (MOS) properties. The reading starts with the definition of the MOS structure, its various aspects and different types of charges presented in their structure. A review on ionic transport mechanisms and techniques for measuring the mobile ions concentration in the oxides is given, special attention being attempted to the Charge Pumping (CP) technique associated with the Bias Thermal Stress (BTS) method. Theoretical approaches to determine the density of mobile ions as well as their distribution along the oxide thickness are also discussed. The content varies from general to very specific examples, helping the reader to learn more about transport in MOS structures.
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Hardback. Condition: New.
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Condition: New. pp. xiv + 106.
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Paperback. Condition: Brand New. 2011 edition. 117 pages. 9.25x6.10x0.28 inches. In Stock.
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Hardcover. Condition: Brand New. 104 pages. 9.00x6.25x0.75 inches. In Stock.
