Girard Patrick Edt (14 results)
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 87.82
£ 1.97 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 95.68
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 98.14
£ 1.97 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 83.04
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 84.14
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2013
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 105.93
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 108.77
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Language: English
Published by Springer, 2013
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 112.33
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 100.95
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 102.38
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Power-aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 121.79
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Power-Aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 159.64
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Power-Aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 161.74
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Power-aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 220.04
£ 1.97 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
