Language: English
Published by The Minerals, Metals & Materials Society, Warrendale, PA, 1993
ISBN 10: 0873392043 ISBN 13: 9780873392044
Seller: Foggy Mountain Books, Oakdale, TN, U.S.A.
Paperback. Condition: Very Good. No Jacket. Soft cover. 1993. Light wear. Firmly bound, no spine crease. Name inside front cover otherwise crisp, bright, unmarked pages Very Good condition.
Condition: Good. [ No Hassle 30 Day Returns ][ Ships Daily ] [ Underlining/Highlighting: NONE ] [ Writing: NONE ] [ Edition: Reprint ] Publisher: TMS Pub Date: 1/1/1996 Binding: Paperback Pages: 391 Reprint edition.
Language: English
Published by Minerals, Metals & Materials Siciety/ SIAM, [1995]., [Warrendale, PA}:, 1995
ISBN 10: 0873393511 ISBN 13: 9780873393515
Seller: Zephyr Used & Rare Books, Vancouver, WA, U.S.A.
First Edition Signed
8vo. ix, [1], 391, [1] pp. 100s of text figures, illusts. Colour-illust. softcvrs, NF, from library of mathematician & physicist, John Simmons, signed. First edition, signed.
Language: English
Published by Springer, 2007
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
Association Member: GIAQ
Hardcover. Condition: Wie neu. 778 S., Like new. Shrink wrapped. / Wie neu. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 1355 3rd corrected Ed. 2008, corr. 2nd printing 2009.
Softcover. Condition: Fair. Spuren von Feuchtigkeit / Nässe; Leichte Kratzer / Abnutzungen / Druckstellen; Gebrochener Buchrücken. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
Seller: HPB-Red, Dallas, TX, U.S.A.
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Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107067243 ISBN 13: 9781107067240
Seller: Textbooks_Source, Columbia, MO, U.S.A.
First Edition
hardcover. Condition: Good. 1st Edition. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
Seller: Mispah books, Redhill, SURRE, United Kingdom
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Language: English
Published by Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
ISBN 10: 3540738851 ISBN 13: 9783540738855
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Hardcover. Condition: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.
Language: English
Published by Cambridge University Press CUP, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. 2nd edition NO-PA16APR2015-KAP.
Language: English
Published by Cambridge University Press, 2020
ISBN 10: 1108485782 ISBN 13: 9781108485784
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