Felix Ntui Ayuk (5 results)

Taschenbuch. Condition: Neu. Surface plasmons resonance spectroscopy | Surface Plasmons resonance spectroscopy and its application to sensor devices. A novel approach with x-ray spectroscopy | Felix Ntui Ayuk | Taschenbuch | 120 S. | Englisch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838128375 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-ray spectroscopy has proven to be one of the most useful tools in the study of thin filmm. The lateral electron density variation within a thin film (measured using x-ray spectroscopy) and the dielectric constant variation of the thin film (investigated using surface plasmons resonance spectroscopy) are however linearly related to one onother. It is in the light of the linearity between these two pyzsical quantities that prompted us to combine both spectroscopic analysis processes in one device. In this way it was posible to use the results obtain from x-ray reflectivity and work back to verify the results obtain from the surface plasmons resonance scans. This was realise for static s well as for dynamic processes within a thin film of polymer. 120 pp. Englisch.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Ntui Ayuk FelixFelix Ntui Ayuk, geboren 1975 in Kamerun.1980-1991 besuchte er den Baptist High School in Buea, Kamerun. Er Studierte Elektrotechnik an der Fachhochschule Bielefeld und dann Physik an der Universitaet Siegen. Er wurde m.…

Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-ray spectroscopy has proven to be one of the most useful tools in the study of thin filmm. The lateral electron density variation within a thin film (measured using x-ray spectroscopy) and the dielectric constant variation of the thin film (investigated using surface plasmons resonance spectroscopy) are however linearly related to one onother. It is in the light of the linearity between these two pyzsical quantities that prompted us to combine both spectroscopic analysis processes in one device. In this way it was posible to use the results obtain from x-ray reflectivity and work back to verify the results obtain from the surface plasmons resonance scans. This was realise for static s well as for dynamic processes within a thin film of polymer.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-ray spectroscopy has proven to be one of the most useful tools in the study of thin filmm. The lateral electron density variation within a thin film (measured using x-ray spectroscopy) and the dielectric constant variation of the thin film (investigated using surface plasmons resonance spectroscopy) are however linearly related to one onother. It is in the light of the linearity between these two pyzsical quantities that prompted us to combine both spectroscopic analysis processes in one device. In this way it was posible to use the results obtain from x-ray reflectivity and work back to verify the results obtain from the surface plasmons resonance scans. This was realise for static s well as for dynamic processes within a thin film of polymer.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 120 pp. Englisch.…