Dwivedi Devesh (28 results)

Condition: New. pp. 75.

Condition: New. pp. 248.

Condition: New. pp. 248.

Condition: New. pp. 248.

Condition: New. Print on Demand pp. 75.

Condition: New. PRINT ON DEMAND pp. 75.

Condition: New. Print on Demand.

Paperback. Condition: new. Paperback. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. FPGA-Based Design and Embedded Systems; Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Hardcover. Condition: new. Hardcover. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. FPGA-Based Design and Embedded Systems; Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Taschenbuch. Condition: Neu. VLSI for Embedded Intelligence | Proceedings of the 27th International Symposium, VDAT 2023 | Anu Gupta (u. a.) | Taschenbuch | Lecture Notes in Electrical Engineering | xx | Englisch | 2024 | Springer | EAN 9789819737550 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Paperback. Condition: Brand New. 416 pages. 9.25x6.10x9.25 inches. In Stock.

Hardcover. Condition: Brand New. 370 pages. 9.25x6.10x9.00 inches. In Stock.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.…

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.…

Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Condition: new. Questo è un articolo print on demand.

Condition: new. Questo è un articolo print on demand.

Condition: new. Questo è un articolo print on demand.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in to.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in.…

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. 416 pp. Englisch.…

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. 372 pp. Englisch.…

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. 372 pp. Englisch.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 416 pp. Englisch.…

Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 372 pp. Englisch.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 372 pp. Englisch.…