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The Canterbury Tales
Language: English
Published by Barnes & Noble Classics/Published by Barnes & Noble Books/Barnes & Noble, Inc., New York, 2006
ISBN 10: 1593083122 ISBN 13: 9781593083120
Mass Market Paperback. Condition: Good. Dutton & Sherman (Cover Design); Walter Appleton Clark (Cover Art) (illustrator). 536 pp. Solidly bound copy with moderate use. Front cover torn along bottom edge. Slightly slanted spine.
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Condition: New.
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Soft cover. Condition: Very Good. ORIGINAL 1979 PUBLICATION; softcover; ex-corporate library; light creasing of corners of covers and a few leaves; o/w in very good condition. Book.
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Soft cover. Condition: Very Good. ORIGINAL 1979 PUBLICATION; softcover; owner's blind stamps; o/w in very good condition. Book.
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Science, Technology, Human Values ; Volume 12 Issue 3 & 4 1987 No. 60 & 61 (Double Issue)
Published by John Wiley & Sons, New York, 1987
Seller: Evolving Lens Bookseller, Kingston, NY, U.S.A.
Association Member: IOBA
Seller rating 4 out of 5 stars
First Edition
Softcover. First Edition, First Printing. Book condition is Very Good, bound in wraps. Some rubbing and edgewear to exterior. Text is clean and unmarked. ; 4to. 11"h x 8 1/2"w. Contents: The Technical and Ethical Aspects of Risk Communication : Frederick W. Allen, Leslie I. Boden, Phil Brown, Rosemary A. Chalk, Richard Davies, Thomas Dietz, Diana B. Dutton, Timothy Edgar, June Fessenden-Raden, Baruch Fischhoff, Janet M. Fitchen, John C. Fletcher, Vicki S. Freimuth, Sharon L. Hammond, Alice J. Hausman, Jenifer S. Heath, Stephen Hilgartner, Sheila Jasanoff, Richard P. Keeling, Sheldon Krimsky, Allan Mazur, David Ozonoff, Carolyn Needleman, Dorothy Nelkin, Alonzo Plough, Deborah Prothrow-Stith, James L. Regens, Judy B. Rosener, Sallie C. Russell, Robert W. Rycroft, Howard Spivak, Dorothy C. Wertz, Rae Zimmerman.
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Process and Device Simulation for MOS-VLSI Circuits (NATO Science Series E:)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.80
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Paperback. Condition: New.
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Condition: good. This book is in Good condition. There may be some notes and highligting but otherwise the book is in overall good condition.
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Condition: New. pp. 638.
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Process and Device Simulation for M.O.S.-V.L.S.I. Circuits
Language: English
Published by Martinus Nijhoff Publishers, 2013
ISBN 10: 9400968442 ISBN 13: 9789400968448
Paperback. Condition: Brand New. 636 pages. 9.25x6.10x1.44 inches. In Stock.
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Australian Poetry 1964 - First Edition
Published by Sydney: Angus and Robertson, 1964
Seller: Benedict Wilson Books, Folkestone, KENT, United Kingdom
Seller rating 5 out of 5 stars
First Edition
Hardcover. Condition: Near Fine. Dust Jacket Included. 1st Edition. FIRST EDITION, first printing. Octavo (20 x 14cm), pp.x; 94. Publisher's green cloth titles in gilt to spine. Dust-jacket with printed price of 15s. to front flap. A little dustiness to edges, dust-jacket lightly handled, toned to spine. Near fine.
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Process and Device Simulation for MOS-VLSI Circuits
Language: English
Published by Springer Netherlands, Springer Netherlands, 2011
ISBN 10: 9400968442 ISBN 13: 9789400968448
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - P. Antognetti University of Genova, Italy Director of the NATO ASI The key importance of VLSI circuits is shown by the national efforts in this field taking place in several countries at differ ent levels (government agencies, private industries, defense de partments). As a result of the evolution of IC technology over the past two decades, component complexi ty has increased from one single to over 400,000 transistor functions per chip. Low cost of such single chip systems is only possible by reducing design cost per function and avoiding cost penalties for design errors. Therefore, computer simulation tools, at all levels of the design process, have become an absolute necessity and a cornerstone in the VLSI era, particularly as experimental investigations are very time-consuming, often too expensive and sometimes not at all feasible. As minimum device dimensions shrink, the need to understand the fabrication process in a quanti tati ve way becomes critical. Fine patterns, thin oxide layers, polycristalline silicon interco~ nections, shallow junctions and threshold implants, each become more sensitive to process variations. Each of these technologies changes toward finer structures requires increased understanding of the process physics. In addition, the tighter requirements for process control make it imperative that sensitivities be unde~ stood and that optimation be used to minimize the effect of sta tistical fluctuations.
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hardcover. Condition: Good. Hardcover ex-library with typical marks shows moderate cover wear. Text is unmarked. Ships FAST!
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Process and device simulation for MOS-VLSI circuits
Language: English
Published by Martinus Nijhoff, Boston, MA, 1983
ISBN 10: 902472824X ISBN 13: 9789024728244
First Edition
Original Cloth. 1st Edition. NATO ASI series. Series E, Applied sciences No. 62. 24 x 16 cm., xii, 619 pp. The book is covered in white cloth with black lettering on the spine and front. CONDITION. VG+/ no dj. The pages are clean and tight. The corners and ends of the spine are lightly rubbed. Library marks and labels on spine and front end papers. Library stamps on page edges. Ex-Library.
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EDA for IC Implementation, Circuit Design, and Process Technology (Electronic Design Automation for Integrated Circuits Hdbk)
Book 1 of 2: Electronic Design Automation for Integrated Circuits HdbkLanguage: English
Published by CRC Press 2006-03-23, 2006
ISBN 10: 0849379245 ISBN 13: 9780849379246
Hardcover. Condition: New.
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hardcover. Condition: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.
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Hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Technology CAD ? Computer Simulation of IC Processes and Devices (The Springer International Series in Engineering and Computer Science, 243)
Book 175 of 260: The Springer International Series in Engineering and Computer ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 209.52
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Technology CAD ? Computer Simulation of IC Processes and Devices (The Springer International Series in Engineering and Computer Science)
Book 175 of 260: The Springer International Series in Engineering and Computer ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 209.52
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Technology CAD
Book 175 of 260: The Springer International Series in Engineering and Computer ScienceLanguage: English
Published by Kluwer Academic Publishers, 1993
ISBN 10: 0792393791 ISBN 13: 9780792393795
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Presents a discourse on process and device CAD as interrelated subjects, building on a wide range of experiences and applications of the SUPREM program. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 373 pages, biography. BIC Classification: TBC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 22. Weight in Grams: 730. . 1993. Hardback. . . . .
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - 129 3.6 Exercises 130 3.7 References. 131 4 PN Junctions 131 4.1 Introduction. 132 4.2 Carrier Densities: Equilibrium Case 4.3 Non-Equilibrium . . 139 4.4 Carrier Transport and Conservation 144 4.5 The pn Junction - Equilibrium Conditions. 147 155 4.6 The pn Junction - Non-equilibrium. 4.7 SEDAN Analysis . . . . . . . . . . . . . 166 4.7.1 Heavy Doping Effects . . 176 4.7.2 Analysis of High-Level Injection 181 190 4.7.3 Technology-Dependent Device Effects 4.8 Summary 193 4.9 Exercises 193 194 4.10 References. 5 MOS Structures 197 5.1 Introduction . . 197 5.2 The MOS Capacitor . . 198 5.3 Basic MOSFET I-V Characteristics. 208 5.4 Threshold Voltage in Nonuniform Substrate 217 5.5 MOS Device Design by Simulation . . . . . 224 5.5.1 Body-bias Sensitivity of Threshold Voltage 225 5.5.2 Two-region Model . . . . . . . . 231 5.5.3 MOSFET Design by Simulation. 234 5.6 Summary 240 5.7 Exercises 240 5.8 References. 242 6 Bipolar Transistors 243 6.1 Introduction . 243 6.2 Lateral pnp Transistor Operation 245 6.3 Transport Current Analysis . 252 6.4 Generalized Charge Storage Model 260 6.,1) Transistor Equivalent Circuits. 267 6.5.1 Charge Control Model .
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Technology CAD
Book 175 of 260: The Springer International Series in Engineering and Computer ScienceLanguage: English
Published by Kluwer Academic Publishers, 1993
ISBN 10: 0792393791 ISBN 13: 9780792393795
Condition: New. Presents a discourse on process and device CAD as interrelated subjects, building on a wide range of experiences and applications of the SUPREM program. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 373 pages, biography. BIC Classification: TBC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 22. Weight in Grams: 730. . 1993. Hardback. . . . . Books ship from the US and Ireland.
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Technology CAD: Computer Simulation of IC Processes and Devices
Published by Springer, New York, 2012
Seller: 32.1 Rare Books + Ephemera, IOBA, ESA, Princeton, NJ, U.S.A.
Association Member: IOBA
Seller rating 4 out of 5 stars
Hardcover. Condition: Very Good. 8vo., 396 pp. Black and white illustrations. Index.
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Condition: new. Questo è un articolo print on demand.
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Process and Device Simulation for MOS-VLSI Circuits
Language: English
Published by Springer Netherlands, Springer Netherlands Okt 2011, 2011
ISBN 10: 9400968442 ISBN 13: 9789400968448
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -P. Antognetti University of Genova, Italy Director of the NATO ASI The key importance of VLSI circuits is shown by the national efforts in this field taking place in several countries at differ ent levels (government agencies, private industries, defense de partments). As a result of the evolution of IC technology over the past two decades, component complexi ty has increased from one single to over 400,000 transistor functions per chip. Low cost of such single chip systems is only possible by reducing design cost per function and avoiding cost penalties for design errors. Therefore, computer simulation tools, at all levels of the design process, have become an absolute necessity and a cornerstone in the VLSI era, particularly as experimental investigations are very time-consuming, often too expensive and sometimes not at all feasible. As minimum device dimensions shrink, the need to understand the fabrication process in a quanti tati ve way becomes critical. Fine patterns, thin oxide layers, polycristalline silicon interco~ nections, shallow junctions and threshold implants, each become more sensitive to process variations. Each of these technologies changes toward finer structures requires increased understanding of the process physics. In addition, the tighter requirements for process control make it imperative that sensitivities be unde~ stood and that optimation be used to minimize the effect of sta tistical fluctuations. 636 pp. Englisch.
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Condition: New. Print on Demand pp. 638 Illus.
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Condition: New. PRINT ON DEMAND pp. 638.
