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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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    Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

    • Softcover

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Kluwer Academic Publishers, 2002

    1402070764 / 9781402070761

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    Condition: New. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. This title presents the feasibility to consider temperature as an observable for testing purposes. Num Pages: 204 pages, 102 black & white illustrations, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 240 x 160 x 14. Weight in Grams: 547. . 2002. Hardback. . . . .…

  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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    Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle

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    Condition: New. pp. 226.

  • Language: English

    Published by Springer US, 2002

    1402070764 / 9781402070761

    • Hardcover

    Seller: Buchpark, Trebbin, GermanyBuchpark

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    Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They work at extremely low voltages and switch at very high frequencies. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure that the manufactured components have the appropriate levels of quality. Along with the ongoing trend towards more advanced technology and circuit features, major testing challenges are continuously emerging. The use of ambivalent procedures to test the analogue and digital sections of such complex circuits without interfering in their nominal operation is clearly a critical part of today's technological ipdustries. Chapter 1 presents the general purposes and basic concepts rel~ted With' the"testing of integrated circuits, discussing the various strategies and their limitations. Readers who are already familiar with the field may opt to skip this chapter. This book offers a multidisciplinary focus on thermal testing. This is a testing method which is not only suitable for use in combination with other existing techniques, but is also backed by a wealth of knowledge and offers exciting opportunities in the form of as yet unexplored areas of research and innovation for industrial applications.…

  • Language: English

    Published by Springer, 2012

    144195287X / 9781441952875

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    Paperback. Condition: Brand New. 224 pages. 9.20x6.10x0.60 inches. In Stock.

  • Language: English

    Published by Kluwer Academic Pub, 2002

    1402070764 / 9781402070761

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    Hardcover. Condition: Brand New. 1st edition. 224 pages. 9.50x6.25x0.50 inches. In Stock.

  • Language: English

    Published by Kluwer Academic Publishers, 2002

    1402070764 / 9781402070761

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    Condition: New. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. This title presents the feasibility to consider temperature as an observable for testing purposes. Num Pages: 204 pages, 102 black & white illustrations, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 240 x 160 x 14. Weight in Grams: 547. . 2002. Hardback. . . . . Books ship from the US and Ireland.…

  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

    • Hardcover

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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  • Language: English

    Published by Springer US, 2011

    144195287X / 9781441952875

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state.…

  • Language: English

    Published by Springer US, 2002

    1402070764 / 9781402070761

    • Hardcover
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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state.…

  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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    Condition: New. Print on Demand pp. 226 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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    Condition: New. PRINT ON DEMAND pp. 226.