Alexe Marin (33 results)

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    • Language: English

      Published by Springer, 2004

      3540206620 / 9783540206620

      • Hardcover

      Seller: Llibreria Hispano Americana, Barcelona, B, SpainLlibreria Hispano Americana

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      Encuadernación de tapa dura. Condition: Nuevo. Dust Jacket Condition: Nuevo.

    • Language: English

      Published by Springer, 2004

      3540206620 / 9783540206620

      • Hardcover

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    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

      • Softcover

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.

    • Language: English

      Published by Springer, 2004

      3540206620 / 9783540206620

      • Hardcover

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.

    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

      • Softcover

      Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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      Condition: New. pp. XIV + 282.

    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

      • Softcover

      Seller: preigu, Osnabrück, Germanypreigu

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      Taschenbuch. Condition: Neu. Nanoscale Characterisation of Ferroelectric Materials | Scanning Probe Microscopy Approach | Marin Alexe (u. a.) | Taschenbuch | NanoScience and Technology | xiii | Englisch | 2010 | Springer | EAN 9783642058448 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

    • Language: English

      Published by Springer Verlag, 2004

      3540206620 / 9783540206620

      • Hardcover

      Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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      Hardcover. Condition: Brand New. 1st edition. 282 pages. German language. 9.50x6.50x0.75 inches. In Stock.

    • Language: English

      Published by Springer Berlin Heidelberg, 2010

      3642058442 / 9783642058448

      • Softcover

      Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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      Paperback. Condition: Brand New. reprint edition. 296 pages. 9.00x6.00x0.71 inches. In Stock.

    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

      • Softcover

      Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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      Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Language: English

      Published by Springer, 2004

      3540206620 / 9783540206620

      • Hardcover

      Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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      Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Language: English

      Published by Springer, 2004

      3540210490 / 9783540210498

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Hardcover

      Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    • Language: English

      Published by Springer, 2011

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover

      Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    • Language: English

      Published by Springer, 2011

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the past decade direct wafer bonding has developed into a mature materials integration technology. This book presents state-of-the-art reviews of the most important applications of wafer bonding written by experts from industry and academia. The topics include bonding-based fabrication methods of silicon-on-insulator, photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and its various application areas, while the researcher in the field will find up-to-date information about this fast-moving area, including relevant patent information.

    • Language: English

      Published by Springer, 2004

      3540210490 / 9783540210498

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Hardcover

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the past decade direct wafer bonding has developed into a mature materials integration technology. This book presents state-of-the-art reviews of the most important applications of wafer bonding written by experts from industry and academia. The topics include bonding-based fabrication methods of silicon-on-insulator,photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and its various application areas, while the researcher in the field will find up-to-date information about this fast-moving area, including relevant patent information.

    • Language: English

      Published by Springer Verlag, 2004

      3540210490 / 9783540210498

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Hardcover

      Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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      Hardcover. Condition: Brand New. 1st edition. 499 pages. 9.25x6.25x0.75 inches. In Stock.

    • Language: English

      Published by Springer, 2012

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover

      Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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      Paperback. Condition: Brand New. 514 pages. 9.00x6.10x1.10 inches. In Stock.

    • Language: English

      Published by J.B. Metzler, 2011

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover

      Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermanyBUCHSERVICE / ANTIQUARIAT Lars Lutzer

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      Softcover. Condition: gut. 2011. Wafer Bonding In deutscher Sprache. pages.

    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

      • Softcover
      • Print on Demand

      Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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    • Language: English

      Published by Springer Berlin Heidelberg Dez 2010, 2010

      3642058442 / 9783642058448

      • Softcover
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      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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      Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics. 300 pp. Englisch.

    • Language: English

      Published by Springer Berlin Heidelberg Apr 2004, 2004

      3540206620 / 9783540206620

      • Hardcover
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      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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      Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics. 300 pp. Englisch.

    • Language: English

      Published by Springer Berlin Heidelberg, 2010

      3642058442 / 9783642058448

      • Softcover
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      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First one on nanoscale characterization of ferroelectric materialsThis book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms .

    • Language: English

      Published by Springer Berlin Heidelberg, 2004

      3540206620 / 9783540206620

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      Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First one on nanoscale characterization of ferroelectric materialsFirst one on nanoscale characterization of ferroelectric materialsIncludes supplementary material: sn.pub/extrasThis book presents recent advances in the field of nan.

    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

      • Softcover
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      Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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      Condition: New. Print on Demand pp. XIV + 282.

    • Language: English

      Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2010, 2010

      3642058442 / 9783642058448

      • Softcover
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      Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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      Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 300 pp. Englisch.

    • Language: English

      Published by Springer Berlin Heidelberg, Springer Apr 2004, 2004

      3540206620 / 9783540206620

      • Hardcover
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      Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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      Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 300 pp. Englisch.

    • Language: English

      Published by Springer, 2010

      3642058442 / 9783642058448

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      Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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      Condition: New. PRINT ON DEMAND pp. XIV + 282.

    • Language: English

      Published by Springer, 2011

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover
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      Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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    • Language: English

      Published by Springer Berlin Heidelberg Sep 2011, 2011

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover
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      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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      Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The topics include bonding-based fabrication methods of silicon-on-insulator, photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and its various application areas, while the researcher in the field will find up-to-date information about this fast-moving area, including relevant patent information. 524 pp. Englisch.

    • Language: English

      Published by Springer Berlin Heidelberg, 2011

      3642059155 / 9783642059155

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Softcover
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      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the current state of the art in wafer bonding - a technology important to microelectronic device manufacturingPresents the current state of the art in wafer bonding - a technology important to microelectronic device manufacturingInclu.

    • Language: English

      Published by Springer Berlin Heidelberg, 2004

      3540210490 / 9783540210498

      Series: Book 62 of 233 - Springer Series in Materials Science

      • Hardcover
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      Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the current state of the art in wafer bonding - a technology important to microelectronic device manufacturingPresents the current state of the art in wafer bonding - a technology important to microelectronic device manufacturingInclu.