Order Total (1 Item Items):
Shipping Destination:
Bhattacharya, Debashis; Hayes, John P (20 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (20)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (16)
- As New, Fine or Near Fine (3)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (7)
- Not Print on Demand (15)
Language (2)
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Hardcover. Condition: New. US SELLER SHIPS FAST FROM USA.
-
-
Condition: New.
-
-
Hierarchical Modelling for Very Large Scale Integration Circuit Testing (Kluwer International Series in Engineering & Computer Science, Vlsi, Computer Architecture & Digit)
Published by Kluwer Academic Publishers, 1989
ISBN 10: 079239058X ISBN 13: 9780792390589
Language: English
Hardcover. Condition: New. Usually Dispatched within 1-2 Business Days , Buy with confidence , excellent customer service.
-
Hierarchical Modeling for Vlsi Circuit Testing
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
-
Condition: As New. Unread book in perfect condition.
-
Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
-
Condition: New. pp. 176.
-
Hierarchical Modeling for Vlsi Circuit Testing
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Condition: New. pp. 176.
-
Gebunden. Condition: New. Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated .
-
Paperback. Condition: Like New. Like New. book.
-
Hierarchical Modeling for VLSI Circuit Testing
Seller: Celler Versandantiquariat, Eicklingen, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
Kluwer, Boston, 1990. X, 159 pages with some graphics, hard cover----former library book in good condition- 460 Gramm.
-
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated .
-
Condition: New. Print on Demand pp. 176 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
-
Condition: New. Print on Demand pp. 176 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
-
Condition: New. PRINT ON DEMAND pp. 176.
-
Condition: New. PRINT ON DEMAND pp. 176.
