Hierarchical Modelling for Very Large Scale Integration Circuit Testing (Kluwer International Series in Engineering & Computer Science, Vlsi, Computer Architecture & Digit)

Debashis Bhattacharya , John P. Hayes

ISBN 10: 079239058X ISBN 13: 9780792390589
Published by Kluwer Academic Publishers, 1989
Language: English
Condition: New Hardcover

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