Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 (Selected Topics in Electronics and Systems) - Hardcover

Fleetwood, Daniel M.

 
9789812389404: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 (Selected Topics in Electronics and Systems)
Hardcover
ISBN 10: 9812389407 ISBN 13: 9789812389404
Publisher: Wspc, 2004

Synopsis

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

"synopsis" may belong to another edition of this title.

Review

"Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects. This book is a great resource ..."

"About this title" may belong to another edition of this title.

Publisher
Wspc
Publication date
2004
Language
English
ISBN 10 
9812389407
ISBN 13 
9789812389404
Binding
Hardcover
Number of pages
348