Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
"synopsis" may belong to another edition of this title.
"Failure Analysis of Integrated Circuits: Tools and Techniques" provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. "Failure Analysis of Integrated Circuits: Tools and Techniques" is a 'must have' reference work for semiconductor professionals and researchers.
"About this title" may belong to another edition of this title.
Seller: Mahler Books, PFLUGERVILLE, TX, U.S.A.
Hardcover. Condition: Very Good. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages. Seller Inventory # 01GW23-679-257
Seller: World of Books (was SecondSale), Montgomery, IL, U.S.A.
Condition: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc. Seller Inventory # 00082498580
Seller: Studibuch, Stuttgart, Germany
hardcover. Condition: Gut. 268 Seiten; 9780412145612.3 Gewicht in Gramm: 1. Seller Inventory # 1053210
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.
hardcover. Condition: New. In shrink wrap. Looks like an interesting title! Seller Inventory # Q-0412145618
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Condition: New. In. Seller Inventory # ria9780412145612_new
Quantity: Over 20 available
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch. Seller Inventory # 9780412145612
Seller: moluna, Greven, Germany
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa. Seller Inventory # 5914199
Quantity: Over 20 available
Seller: preigu, Osnabrück, Germany
Buch. Condition: Neu. Failure Analysis of Integrated Circuits | Tools and Techniques | Lawrence C. Wagner | Buch | The Springer International Series in Engineering and Computer Science | xiii | Englisch | 1999 | Springer | EAN 9780412145612 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Seller Inventory # 102610198
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. pp. 276. Seller Inventory # 26321430
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Condition: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . . Seller Inventory # V9780412145612