Items related to Failure Analysis of Integrated Circuits: Tools and...
Failure Analysis of Integrated Circuits: Tools and Techniques: 494 (The Springer International Series in Engineering and Computer Science, 494) - Softcover
Synopsis
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
"synopsis" may belong to another edition of this title.
- PublisherSpringer
- Publication date2012
- ISBN 10 1461372313
- ISBN 13 9781461372318
- BindingPaperback
- LanguageEnglish
- Number of pages268
- EditorWagner Lawrence C.
Search results for Failure Analysis of Integrated Circuits: Tools and...
Seller Image
Failure Analysis of Integrated Circuits : Tools and Techniques
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 19494716-n
Quantity: Over 20 available
Stock Image
Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9781461372318_new
Quantity: Over 20 available
Seller Image
Failure Analysis of Integrated Circuits
Print on DemandSeller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa. Seller Inventory # 4195376
Quantity: Over 20 available
Seller Image
Failure Analysis of Integrated Circuits
Print on DemandSeller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch. Seller Inventory # 9781461372318
Quantity: 2 available
Seller Image
Failure Analysis of Integrated Circuits : Tools and Techniques
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 19494716-n
Quantity: Over 20 available
Seller Image
Failure Analysis of Integrated Circuits : Tools and Techniques
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers. Seller Inventory # 9781461372318
Quantity: 1 available
Seller Image
Failure Analysis of Integrated Circuits
Published by
Springer US, Springer New York Nov 2012, 2012
ISBN 10: 1461372313
ISBN 13: 9781461372318
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch. Seller Inventory # 9781461372318
Quantity: 2 available
Stock Image
Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLIING23Mar2716030033715
Quantity: Over 20 available
Seller Image
Failure Analysis of Integrated Circuits : Tools and Techniques
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 19494716
Quantity: Over 20 available
Stock Image
Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
Paperback. Condition: Like New. Like New. book. Seller Inventory # ERICA79714613723136
Quantity: 1 available