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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1970 (Classic Reprint) - Softcover
Synopsis
Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1970
This is the tenth quarterly report to the sponsors of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices. It summarizes work on a wide variety of measure ment methods that are being studied at the National Bureau of Standards. Since the Program is a continuing one, the results and conclusions re ported here are subject to modification and refinement.
Fourteen tasks, each directed toward a particular material or device property or measurement technique, have been identified as parts of the Program. The report is subdivided according to these tasks. Highlights of activity during the quarter are given in Section 2. Section 3 deals with tasks on methods of measurement for materials; Section 4, with those on methods of measurement for process control; and Section 5, with those on methods of measurement for devices. References for each section are listed in a separate subsection at the end of that section.
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Methods of Measurement for Semiconductor Materials, Process Control, and
Print on DemandSeller: Forgotten Books, London, United Kingdom
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Paperback. Condition: New. Print on Demand. This book presents the results of the tenth reporting period in a series of studies focused on methods of measurement for semiconductor materials, process control, and devices. The Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices was undertaken in 1968 to focus NBS efforts to enhance the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits through improvements in methods of measurement. The program is supported by the National Bureau of Standards, the Defense Atomic Support Agency, the U.S. Navy Strategic Systems Project Office, the U.S. Navy Electronics Systems Command, the Atomic Energy Commission, and the National Aeronautics and Space Administration. Through this research, the author has made significant contributions to the development of new measurement methods and the improvement of existing ones in the field of semiconductor materials, process control, and devices. The book discusses the long term objectives of the program, as well as its accomplishments and plans for the immediate future. The research detailed in this text will be valuable to semiconductor researchers, manufacturers, and users, as well as to standards organizations and government agencies. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9780365779025_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780365779025
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780365779025
Quantity: 15 available