Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971
This is the eleventh quarterly report to the sponsors of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices. It summarizes work on a wide variety of measure ment methods that are being studied at the National Bureau of Standards.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780260813602
Quantity: 15 available