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Transmission Electron Microscopy Methods for Understanding the Brain.
Language: English
Published by New York, Humana Press., 2016
ISBN 10: 149398103X ISBN 13: 9781493981038
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
XIV, 246 p. Softcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Neuromethods. Volume 115. Sprache: Englisch.
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Transmission Electron Microscopy: Methods of Application
Language: English
Published by Charles C Thomas Pub Ltd 1983-05, 1983
ISBN 10: 0398047138 ISBN 13: 9780398047139
Paperback. Condition: Good. Good. No dust jacket as issued. Ex-library. Ex-library (Boeing) with typical markings. Interior clean, binding sound. Moderate wear to covers.
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Condition: As New. Unread book in perfect condition.
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Scanning Transmission Electron Microscopy : Advanced Characterization Methods for Materials Science Applications
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
Language: English
Published by Taylor & Francis Ltd, 2024
ISBN 10: 0367655381 ISBN 13: 9780367655389
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Paperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
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Scanning Transmission Electron Microscopy : Advanced Characterization Methods for Materials Science Applications
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 60.71
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Integrated light, electron transmission, scanning and confocal laser: Multiple microscopy methods applied to the cerebellar cortex
Language: English
Published by LAP LAMBERT Academic Publishing, 2024
ISBN 10: 6207641116 ISBN 13: 9786207641116
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 64.28
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Paperback. Condition: Brand New. 164 pages. 9.18x6.12x9.21 inches. In Stock.
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Condition: As New. Unread book in perfect condition.
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Transmission Electron Microscopy Methods for Understanding the Brain (Neuromethods, 115)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
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Transmission Electron Microscopy Methods for Understanding the Brain (Neuromethods, 115)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
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Transmission Electron Microscopy Methods for Understanding the Brain
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New. pp. XIV, 246 61 illus., 36 illus. in color. 1 Edition NO-PA16APR2015-KAP.
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Integrated light, electron transmission, scanning and confocal laser | Multiple microscopy methods applied to the cerebellar cortex
Language: English
Published by LAP LAMBERT Academic Publishing, 2024
ISBN 10: 6207641116 ISBN 13: 9786207641116
Taschenbuch. Condition: Neu. Integrated light, electron transmission, scanning and confocal laser | Multiple microscopy methods applied to the cerebellar cortex | Orlando Castejon | Taschenbuch | Englisch | 2024 | LAP LAMBERT Academic Publishing | EAN 9786207641116 | Verantwortliche Person für die EU: SIA OmniScriptum Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu.
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![Stock image for Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. for sale by BUCHSERVICE / ANTIQUARIAT Lars Lutzer](https://pictures.abebooks.com/isbn/9783540738855-uk-300.jpg)
Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Language: English
Published by Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
ISBN 10: 3540738851 ISBN 13: 9783540738855
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Seller rating 4 out of 5 stars
Hardcover. Condition: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.
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Transmission Electron Microscopy Methods for Understanding the Brain
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 107.78
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: New. pp. 246.
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Scanning Transmission Electron Microscopy : Advanced Characterization Methods for Materials Science Applications
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: As New. Unread book in perfect condition.
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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
Language: English
Published by CRC Press 2020-12-21, 2020
ISBN 10: 0367197367 ISBN 13: 9780367197360
Hardcover. Condition: New.
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Hardcover. Condition: Brand New. 10.00x7.25x0.75 inches. In Stock.
