Testing Asic Fpga Circuits by Raj Sumit (4 results)

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  • Language: English

    Published by LAP Lambert Academic Publishing, 2012

    3659275859 / 9783659275852

    • Softcover

    Seller: preigu, Osnabrück, Germanypreigu

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    Taschenbuch. Condition: Neu. Testing of ASIC and FPGA circuits | VLSI testing and verification | Sumit Raj | Taschenbuch | Englisch | LAP Lambert Academic Publishing | EAN 9783659275852 | Verantwortliche Person für die EU: LAP Lambert Academic Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu.

  • Language: English

    Published by LAP LAMBERT Academic Publishing, 2012

    3659275859 / 9783659275852

    • Softcover

    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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    Condition: Used - As new

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    Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Language: English

    Published by LAP LAMBERT Academic Publishing, 2012

    3659275859 / 9783659275852

    • Softcover
    • Print on Demand

    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Raj SumitI have done B.Tech in electornics and MS by research in VLSI testing from IIIT Hyderabad, India.Currently I am working for nVIDIA graphics as hardware engg in dft team.This is my first book, related to my masters thesis .

  • Language: English

    Published by LAP Lambert Academic Publishing, 2012

    3659275859 / 9783659275852

    • Softcover
    • Print on Demand

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.