Structure Analysis Small Angle X Ray by Feigin L A (14 results)

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  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 1987

    0306426293 / 9780306426292

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    hardcover. Condition: Gut. 348 Seiten; 9780306426292.3 Gewicht in Gramm: 1.

  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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  • Language: English

    Published by Springer US, 2013

    1475766262 / 9781475766264

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  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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    Condition: New. pp. 352.

  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Paperback. Condition: Brand New. reprint edition. 348 pages. 8.75x6.00x0.50 inches. In Stock.

  • Language: English

    Published by Springer, Chapman And Hall/CRC, 2013

    1475766262 / 9781475766264

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    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.

  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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  • Language: English

    Published by Springer, 1987

    0306426293 / 9780306426292

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    Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermanyBUCHSERVICE / ANTIQUARIAT Lars Lutzer

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    Condition: gut. 1987. Structure Analysis by Small-Angle X-Ray and Neutron Scattering In englischer Sprache. pages.

  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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    Condition: new. Questo è un articolo print on demand.

  • Language: English

    Published by Springer-Verlag New York Inc., 2013

    1475766262 / 9781475766264

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    Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    Condition: New. Print on Demand pp. 352 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Language: English

    Published by Springer, Chapman And Hall/CRC Jun 2013, 2013

    1475766262 / 9781475766264

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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 352 pp. Englisch.

  • Language: English

    Published by Springer, 2013

    1475766262 / 9781475766264

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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. 352.