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Spatial Point Patterns Methodology by Baddeley Adrian (8 results)
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Language: English
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Spatial Point Patterns : Methodology and Applications With R
Language: English
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Condition: As New. Unread book in perfect condition.
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Spatial Point Patterns : Methodology and Applications With R
Language: English
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Condition: New.
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Spatial Point Patterns : Methodology and Applications With R
Language: English
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 110.08
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Language: English
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 122.74
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Spatial Point Patterns : Methodology and Applications With R
Language: English
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 121.56
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Hardcover. Condition: Brand New. 810 pages. 9.00x7.00x2.00 inches. In Stock.
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Spatial Point Patterns : Methodology and Applications with R
Language: English
Published by Chapman And Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.
