Scanning Electron Microscopy Physics by Reimer Ludwig (21 results)
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Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Soft cover. Condition: Near Fine. 2nd Edition. Near Fine softcover. Previous owner's name and date on the first page, else Fine Clean, bright and tight. No writing or other marks. We wrap and box our books for shipping.
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- Hardcover
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Language: English
Published by Springer, 1998
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Hardcover
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Hardcover. Condition: Fine. 2nd Edition. EXCELLENT Unmarked PAGES And BINDING And COVER. Hardback. No dust Jacket, as issued. From the library of a Lawrence Livermore physicist. Approximately 6 X 9 ½. 527 pages.
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Published by Springer, 1998
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Published by Berlin ; Heidelberg ; Tokyo ; New York ; Barcelona ; Budapest ; Hong Kong ; London ; Milan ; Paris ; Singapore : Springer, 1998
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Pp. 2., completely rev. and updated ed. XIV, 527 S. : Ill., graph. Darst. ; 24 cm Sprache: Englisch Gewicht in Gramm: 882.
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Published by Springer-Verlog, 1985
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Published by Springer, 1998
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Published by Springer, 1998
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Condition: Gut. Zustand: Gut | Seiten: 544 | Sprache: Englisch | Produktart: Bücher | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced…currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Language: English
Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Softcover
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Language: English
Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
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Language: English
Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Softcover
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Language: English
Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Softcover
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Published by Springer, 2010
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Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Softcover
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Language: English
Published by Springer, Springer, 1998
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X…-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Language: English
Published by Springer, 2010
Series: Springer Series in Optical Sciences, Book 56 of 235. Book 56 of 235 - Springer Series in Optical Sciences
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced curr…ents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
