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Scanning Electron Microscopy Physics (20 results)
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Condition: As New. Unread book in perfect condition.
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 45.68
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Condition: New.
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Fine. 2nd Edition. EXCELLENT Unmarked PAGES And BINDING And COVER. Hardback. No dust Jacket, as issued. From the library of a Lawrence Livermore physicist. Approximately 6 X 9 ½. 527 pages.
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hardcover. Condition: Very Good. Orders shipped daily from the UK. Professional seller.
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Scanning electron microscopy : physics of image formation and microanalysis. Springer series in optical sciences ; Vol. 45
Book 56 of 235: Springer Series in Optical SciencesLanguage: English
Published by Berlin ; Heidelberg ; Tokyo ; New York ; Barcelona ; Budapest ; Hong Kong ; London ; Milan ; Paris ; Singapore : Springer, 1998
ISBN 10: 3540639764 ISBN 13: 9783540639763
Seller: Hübner Einzelunternehmen, Hamburg, HH, Germany
Seller rating 5 out of 5 stars
Pp. 2., completely rev. and updated ed. XIV, 527 S. : Ill., graph. Darst. ; 24 cm Sprache: Englisch Gewicht in Gramm: 882.
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
Book 56 of 235: Springer Series in Optical SciencesSeller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Condition: Gut. Zustand: Gut | Seiten: 544 | Sprache: Englisch | Produktart: Bücher | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
Book 56 of 235: Springer Series in Optical SciencesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 253.85
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
Book 56 of 235: Springer Series in Optical SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 260.72
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Condition: As New. Unread book in perfect condition.
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
Book 56 of 235: Springer Series in Optical SciencesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 288.06
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
