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Ray Diffraction Structure Principles by Shih (11 results)
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X-Ray Diffraction: Structure, Principles and Applications
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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X-Ray Diffraction: Structure, Principles and Applications
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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X-Ray Diffraction: Structure, Principles & Applications
Language: English
Published by Nova Science Publishers Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Editor(s): Shih, Kaimin. Num Pages: 248 pages, illustrations. BIC Classification: TGM. Category: (G) General (US: Trade). Dimension: 258 x 182 x 21. Weight in Grams: 690. . 2013. UK ed. Hardcover. . . . .
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X-Ray Diffraction : Structure, Principles and Applications
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Condition: New.
-
X-Ray Diffraction : Structure, Principles and Applications
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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X-Ray Diffraction : Structure, Principles and Applications
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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X-Ray Diffraction: Structure, Principles and Applications (Materials Science and Technologies)
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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X-Ray Diffraction : Structure, Principles and Applications
Language: English
Published by Nova Science Pub Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Condition: As New. Unread book in perfect condition.
-
X-Ray Diffraction: Structure, Principles & Applications
Language: English
Published by Nova Science Publishers Inc, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Condition: New. Editor(s): Shih, Kaimin. Num Pages: 248 pages, illustrations. BIC Classification: TGM. Category: (G) General (US: Trade). Dimension: 258 x 182 x 21. Weight in Grams: 690. . 2013. UK ed. Hardcover. . . . . Books ship from the US and Ireland.
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X-Ray Diffraction : Structure, Principles & Applications
Language: English
Published by Nova Science Publishers Inc Sep 2013, 2013
ISBN 10: 1628085916 ISBN 13: 9781628085914
Buch. Condition: Neu. Neuware - An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge boundaries. Written by more than 30 X-ray diffraction experts from 9 countries/regions, this book consists of 11 chapters examining the development of the XRD technique and demonstrating various new opportunities for its application. Each chapter discusses timely and important subjects surrounding the XRD technique, including the past and future of the single-crystal XRD technique and new explorations with co-ordination polymers; the very successful implementation of Rietveld refinement analysis for alloys, intermetallics, cements, and ceramics; the application of XRD in nanoparticles structure study; the methodological developments in quantifying the state of residual stress in materials; and the state-of-the-art progress in combining XRD principles with electron crystallography for structure determination.
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International EditionCondition: New. Brand New! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
