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Optical Characterization Techniques for Semiconductor Technology: Volume 276. Proceedings of SPIE; 1-2 April 1981, San Jose, California
Language: English
Published by SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1981
ISBN 10: 0892523093 ISBN 13: 9780892523092
First Edition
Paperback. Condition: Very Good. No Jacket. 1st. Seller's image, know what you are getting! Pre-packing weight is 1 lb. 2.8 oz . ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! NO Dust Jacket. Has or May Have all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! See Picture! The Copyright date is 1981 for this Printing. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. Size: 4to Size: 4to - over 9¾ - 12" tall. Ex-Library.
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Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices: Volume 794, Proceedings; 26-27 March 1987, Bay Point, Florida, SPIE.
Language: English
Published by SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1987
ISBN 10: 089252829X ISBN 13: 9780892528295
First Edition
Paperback. Condition: Good. No Jacket. 1st. W/full markings, pocket, and/or bookplate. Hinged internally at several places, loose pages but complete. Size: 4to. Ex-Library.
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Advanced Optical Spectroscopy Techniques for Semiconductor Materials Characterization
Language: English
Published by Springer International Publishing, 2023
ISBN 10: 3031197216 ISBN 13: 9783031197215
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers the physical principles and best operating practices of a range of optical spectroscopy techniquesLooks at a broad class of semiconductor materials such as silicon, nano-diamond thin films, and gallium oxideIncludes a chapter devoted.
