Nonlinear Transistor Model Parameter (19 results)

Hardcover. Condition: Like New. First Edition. A firm, square and tight hardback with strong joints, just showing a few minor bumps and some mild cosmetic wear. Hence a non-text page is stamped 'damaged'. Despite such this book is actually in nearly new condition. Thus the contents are crisp, fresh and clean with no pen-marks. Now offered for sale at a very reasonable price.

Condition: New. pp. 366.

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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condition: New. pp. 366 273 Illus.

Condition: New. pp. 366.

Condition: Sehr gut. Zustand: Sehr gut | Seiten: 366 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

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Hardcover. Condition: new. Hardcover. Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction. Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Hardcover. Condition: Brand New. 1st edition. 460 pages. 10.00x7.00x0.75 inches. In Stock.

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Gebunden. Condition: New. Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, e.

Hardcover. Condition: new. Hardcover. Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction. Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Buch. Condition: Neu. Neuware - Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction.

Hardcover. Condition: new. Hardcover. Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction. Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

paperback. Condition: New. Paperback. Pub Date: 2020-10-01 Pages: 326 Language: Chinese Publisher: National Defense Industry Press Transistor Nonlinear Model Parameter Extraction Technology aims to provide a comprehensive overview of transistor model parameter extraction: On the one hand. the basic premise is the parameter The extraction is as important as the establishment of a physical model based on itself; on the other hand. even for different technologies. the extraction methods are often based on the same ideas a.