Parameter Extraction Technology of Transistor Nonlinear Model(Chinese Edition) - Softcover

[ DE ] MA DI YA SI · LU DAO FU ( Matthias Rudolph ) , WANG YING , DONG SHI WEI , DONG YA ZHOU DENG YI

 
9787118120677: Parameter Extraction Technology of Transistor Nonlinear Model(Chinese Edition)

Synopsis

Language:Chinese.paperback.Pub Date:2020-10-01.publisher:National Defense Industry Press.description:Paperback. Pub Date: 2020-10-01 Pages: 326 Language: Chinese Publisher: National Defense Industry Press Transistor Nonlinear Model Parameter Extraction Technology aims to provide a comprehensive overview of transistor model parameter extraction: On t

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