Modeling Nanoscale Imaging Electron (23 results)
Language: English
Published by Springer, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
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Published by Springer, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer 2014-04-13, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer New York, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer New York, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Condition: New. pp. 194.
Language: English
Published by Springer, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nan…oscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Modeling Nanoscale Imaging in Electron Microscopy
Vogt, Thomas (Editor)/ Dahmen, Wolfgang (Editor)/ Binev, Peter (Editor)
Language: English
Published by Springer Verlag, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
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Modeling Nanoscale Imaging in Electron Microscopy
Vogt, Thomas (Editor)/ Dahmen, Wolfgang (Editor)/ Binev, Peter G. (Editor)
Language: English
Published by Springer Verlag, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
- Hardcover
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Hardcover. Condition: Brand New. 2012 edition. 280 pages. 9.25x6.00x0.50 inches. In Stock.
More imagesLanguage: English
Published by Springer, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
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Taschenbuch. Condition: Neu. Modeling Nanoscale Imaging in Electron Microscopy | Thomas Vogt (u. a.) | Taschenbuch | Nanostructure Science and Technology | ix | Englisch | 2014 | Springer | EAN 9781489997289 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]sp…ringer[dot]com | Anbieter: preigu.
Language: English
Published by Springer New York, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
- Hardcover
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nan…oscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Language: English
Published by Springer, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Language: English
Published by Springer, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
- Print on Demand
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Language: English
Published by Springer New York Apr 2014, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly e…xpanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. 192 pp. Englisch.
Language: English
Published by Springer New York Mrz 2012, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
- Hardcover
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expandin…g the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing 192 pp. Englisch.
Language: English
Published by Humana, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the… nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. ; Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Language: English
Published by Springer, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Condition: New. Print on Demand pp. 194 80 Illus. (32 Col.).
Language: English
Published by Springer, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Condition: New. PRINT ON DEMAND pp. 194.
Language: English
Published by Springer, Springer Mär 2012, 2012
Series: Book 25 of 60 - Nanostructure Science and Technology
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding th…e nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.
Language: English
Published by Springer, Springer Apr 2014, 2014
Series: Book 25 of 60 - Nanostructure Science and Technology
- Softcover
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Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expan…ding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 192 pp. Englisch.
