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Modeling Nanoscale Imaging in Electron Microscopy (Nanostructure Science and Technology)
Book 25 of 60: Nanostructure Science and TechnologySeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Modeling Nanoscale Imaging in Electron Microscopy (Nanostructure Science and Technology)
Book 25 of 60: Nanostructure Science and TechnologySeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 194.
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Paperback. Condition: Brand New. 191 pages. 9.25x6.10x0.46 inches. In Stock.
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Hardcover. Condition: Brand New. 2012 edition. 280 pages. 9.25x6.00x0.50 inches. In Stock.
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Taschenbuch. Condition: Neu. Modeling Nanoscale Imaging in Electron Microscopy | Thomas Vogt (u. a.) | Taschenbuch | Nanostructure Science and Technology | ix | Englisch | 2014 | Springer | EAN 9781489997289 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Modeling Nanoscale Imaging in Electron Microscopy
Book 25 of 60: Nanostructure Science and TechnologyLanguage: English
Published by Springer New York, Springer US, 2012
ISBN 10: 146142190X ISBN 13: 9781461421900
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. ; Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
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Paperback. Condition: Like New. Like New. book.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days.
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Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Modeling Nanoscale Imaging in Electron Microscopy
Book 25 of 60: Nanostructure Science and TechnologyLanguage: English
Published by Springer New York Apr 2014, 2014
ISBN 10: 1489997288 ISBN 13: 9781489997289
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. 192 pp. Englisch.
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Modeling Nanoscale Imaging in Electron Microscopy
Book 25 of 60: Nanostructure Science and TechnologyLanguage: English
Published by Springer New York Mrz 2012, 2012
ISBN 10: 146142190X ISBN 13: 9781461421900
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing 192 pp. Englisch.
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Condition: New. Print on Demand pp. 194 80 Illus. (32 Col.).
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Condition: New. PRINT ON DEMAND pp. 194.
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Buch. Condition: Neu. Modeling Nanoscale Imaging in Electron Microscopy | Thomas Vogt (u. a.) | Buch | Nanostructure Science and Technology | ix | Englisch | 2012 | Springer | EAN 9781461421900 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
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Modeling Nanoscale Imaging in Electron Microscopy
Book 25 of 60: Nanostructure Science and TechnologyLanguage: English
Published by Springer, Springer Mär 2012, 2012
ISBN 10: 146142190X ISBN 13: 9781461421900
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.
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Modeling Nanoscale Imaging in Electron Microscopy
Book 25 of 60: Nanostructure Science and TechnologyLanguage: English
Published by Springer, Springer Apr 2014, 2014
ISBN 10: 1489997288 ISBN 13: 9781489997289
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 192 pp. Englisch.
