Modeling Nanoscale Imaging in Electron Microscopy (Nanostructure Science and Technology) - Softcover

Softcover

ISBN 10: 1489997288 ISBN 13: 9781489997289

Publisher: Springer, 2014

Synopsis

This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

About this title

Review:

From the reviews:

“In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. ... That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the physical sciences. Modeling Nanoscale Imaging in Electron Microscopy will be an important resource for graduate students and researchers in the area of high-resolution electron microscopy.” (Les J. Allen, Physics Today, Vol. 65 (5), May, 2012)

From the Back Cover:

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing

About this edition

• Publisher: Springer
• Publication date: 2014
• ISBN 10: 1489997288
• ISBN 13: 9781489997289
• Binding: Paperback
• Number of pages: 191
• Editor: Vogt Thomas, Dahmen Wolfgang, Binev Peter