Lifetime Spectroscopy Method Defect by Rein Stefan (11 results)

Language: English
Published by Springer, 2010
Series: Book 3 of 233 - Springer Series in Materials Science
- Softcover
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Language: English
Published by Springer, 2010
Series: Book 3 of 233 - Springer Series in Materials Science
- Softcover
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More imagesLifetime Spectroscopy | A Method of Defect Characterization in Silicon for Photovoltaic Applications
Language: English
Published by Springer, 2010
Series: Book 3 of 233 - Springer Series in Materials Science
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Lifetime Spectroscopy | A Method of Defect Characterization in Silicon for Photovoltaic Applications | Stefan Rein | Taschenbuch | Springer Series in Materials Science | xxvi | Englisch | 2010 | Springer | EAN 9783642064531 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Language: English
Published by Springer, 2005
Series: Book 3 of 233 - Springer Series in Materials Science
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In English.

Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Language: English
Published by Springer, 2010
Series: Book 3 of 233 - Springer Series in Materials Science
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Language: English
Published by Springer, 2010
Series: Book 3 of 233 - Springer Series in Materials Science
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.…

Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Language: English
Published by Springer, 2005
Series: Book 3 of 233 - Springer Series in Materials Science
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.…

Language: English
Published by Springer, 2005
Series: Book 3 of 233 - Springer Series in Materials Science
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Language: English
Published by Springer Verlag, 2010
Series: Book 3 of 233 - Springer Series in Materials Science
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 515 pages. 9.21x6.14x1.05 inches. In Stock.

Language: English
Published by Springer Verlag, 2005
Series: Book 3 of 233 - Springer Series in Materials Science
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Hardcover. Condition: Brand New. 1st edition. 489 pages. German language. 9.25x6.50x0.75 inches. In Stock.

Language: English
Published by Springer, 2005
Series: Book 3 of 233 - Springer Series in Materials Science
- Hardcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title.