Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Rein, Stefan

ISBN 10: 3642064531 / ISBN 13: 9783642064531

Published by Springer Verlag, 2010

About this Item

515 pages. 9.21x6.14x1.05 inches. In Stock.

Seller Inventory # x-3642064531

Bibliographic Details

• Title: Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
• Publisher: Springer Verlag
• Publication Date: 2010
• Language: English
• ISBN 10: 3642064531
• ISBN 13: 9783642064531
• Binding: Paperback
• Condition: Brand New

About this title

Synopsis

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

About the Author

10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg

09/99 – 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)

08/95 – 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization

12/98 – 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells – materials – technology
2. in the department of thermal optical systems

06/04 – today Research assistant at Fraunhofer ISE