High Quality Test Pattern by Eggersglüß Stephan (18 results)
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XVIII, 193 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT)Describes a highly fault efficient SAT-based ATPG frameworkIncludes an industrial perspective on the state-of-the-art in the tes…ting, along with SAT t.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT)Describes a highly fault efficient SAT-based ATPG frameworkIncludes an industrial perspective on the state-of-the-art in the tes…ting, along with SAT t.
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Buch. Condition: Neu. High Quality Test Pattern Generation and Boolean Satisfiability | Stephan Eggersglüß (u. a.) | Buch | xviii | Englisch | 2012 | Springer | EAN 9781441999757 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: pr…eigu Print on Demand.
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is prese…nted which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages:Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT);Describes a highly fault efficient SAT-based ATPG framework;Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 212 pp. Englisch.
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework i…s presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages:Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT);Describes a highly fault efficient SAT-based ATPG framework;Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 212 pp. Englisch.
