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Fault Diagnosis Analog Integrated by Kabisatpathy Prithviraj (27 results)
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Fault Diagnosis of Analog Integrated Circuits.
Published by Boston, MA, Springer US., 2005
ISBN 10: 038725742X ISBN 13: 9780387257426
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
£ 8.94
Convert currency£ 10.42 shipping from Germany to United KingdomQuantity: 1 available
Add to basketHardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Frontiers in Electronic Testing, 30. Sprache: Englisch.
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Fault Diagnosis of Analog Integrated Circuits
Published by Springer Nature (Sie), 2008
ISBN 10: 8181288629 ISBN 13: 9788181288622
Language: English
£ 12.92
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Add to basketSoft cover. Condition: New. ISBN:9788181288622.
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£ 28.50
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Add to basketCondition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
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£ 49.49
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Add to basketCondition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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£ 92.85
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Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing, 30)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 98.33
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential.The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
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Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing, 30)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 108.02
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Add to basketCondition: New. pp. 196.
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£ 111.13
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Add to basketGebunden. Condition: New. A valuable reference for Test Engineers and Analog IC designersFault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this .
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Paperback. Condition: Brand New. 192 pages. 9.40x6.20x0.70 inches. In Stock.
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Fault Diagnosis of Analog Integrated Circuits
Published by Springer Us Nov 2005, 2005
ISBN 10: 038725742X ISBN 13: 9780387257426
Language: English
£ 145.73
Convert currency£ 12.15 shipping from Germany to United KingdomQuantity: 2 available
Add to basketBuch. Condition: Neu. Neuware - System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential.The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
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£ 82.53
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A valuable reference for Test Engineers and Analog IC designersFault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this .
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Fault Diagnosis of Analog Integrated Circuits
Published by Springer US Jan 2011, 2011
ISBN 10: 1441938281 ISBN 13: 9781441938282
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
£ 95.69
Convert currency£ 9.55 shipping from Germany to United KingdomQuantity: 2 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.Examinesthe testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .Also contains problems that can be used as quiz or homework. 196 pp. Englisch.
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Fault Diagnosis of Analog Integrated Circuits
Published by Springer-Verlag New York Inc., 2005
ISBN 10: 038725742X ISBN 13: 9780387257426
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 114.67
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Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 484.
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Fault Diagnosis of Analog Integrated Circuits
Published by Springer US, Springer US Jan 2011, 2011
ISBN 10: 1441938281 ISBN 13: 9781441938282
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
£ 95.69
Convert currency£ 30.39 shipping from Germany to United KingdomQuantity: 1 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential.The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 196 pp. Englisch.
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Fault Diagnosis of Analog Integrated Circuits
Published by Springer-Verlag New York Inc., 2011
ISBN 10: 1441938281 ISBN 13: 9781441938282
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 126.73
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 342.
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Condition: New. Print on Demand pp. 196 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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£ 136.87
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Add to basketCondition: New. PRINT ON DEMAND pp. 196.
