Fault Diagnosis of Analog Integrated Circuits

Prithviraj Kabisatpathy

ISBN 10: 1441938281 / ISBN 13: 9781441938282

Published by Springer US Jan 2011, 2011

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.Examinesthe testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .Also contains problems that can be used as quiz or homework. 196 pp. Englisch.

Seller Inventory # 9781441938282

Bibliographic Details

• Title: Fault Diagnosis of Analog Integrated Circuits
• Publisher: Springer US Jan 2011
• Publication Date: 2011
• Language: English
• ISBN 10: 1441938281
• ISBN 13: 9781441938282
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 11D millimeters 235 millimeters width by 155 millimeters height by 11 millimeters depth
• Weight: 306 grams

About this title

Synopsis

Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.