Seller: Anybook.com, Lincoln, United Kingdom
Condition: Poor. Volume 9. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:3540158332.
Condition: New. pp. xviii + 349.
Seller: Revaluation Books, Exeter, United Kingdom
Paperback. Condition: Brand New. 1986 edition. 349 pages. 9.50x6.10x0.90 inches. In Stock.
Language: English
Published by Springer Berlin Heidelberg, 2014
ISBN 10: 3642500331 ISBN 13: 9783642500336
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.
Language: English
Published by Springer-Verlag GmbH, 2014
ISBN 10: 3642500331 ISBN 13: 9783642500336
Seller: preigu, Osnabrück, Germany
Taschenbuch. Condition: Neu. EXAFS: Basic Principles and Data Analysis | Boon K. Teo | Taschenbuch | xviii | Englisch | 2014 | Springer-Verlag GmbH | EAN 9783642500336 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Seller: Salish Sea Books, Bellingham, WA, U.S.A.
Hardcover. Condition: Good. 0387158332 Good+; Hardcover; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Good binding; This book will be stored and delivered in a sturdy cardboard box with foam padding; Medium-Large Format (Quatro, 9.75" - 10.75" tall); Orange cloth covers with title in black lettering; 1986, Springer-Verlag Publishing; 349 pages; "Exafs: Basic Principles and Data Analysis (Inorganic Chemistry Concepts)," by Boon K. Teo.
Seller: Mispah books, Redhill, SURRE, United Kingdom
Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer Berlin Heidelberg, Springer Apr 2014, 2014
ISBN 10: 3642500331 ISBN 13: 9783642500336
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners. 368 pp. Englisch.
Seller: Majestic Books, Hounslow, United Kingdom
Condition: New. Print on Demand pp. xviii + 349.
Seller: Biblios, Frankfurt am main, HESSE, Germany
Condition: New. PRINT ON DEMAND pp. xviii + 349.
Language: English
Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Apr 2014, 2014
ISBN 10: 3642500331 ISBN 13: 9783642500336
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 368 pp. Englisch.