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Detectors Characterization Hep Photon by Srivastava Ajay (28 results)
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Si Detectors and Characterization for HEP and Photon Science Experiment. How to Design Detectors by TCAD Simulation.
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
XVII, 183 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
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Si Detectors and Characterization for HEP and Photon Science Experiment: How to Design Detectors by TCAD Simulation
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Condition: New. pp. XVII, 183 106 illus., 77 illus. in color. 1 Edition NO-PA16APR2015-KAP.
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Si Detectors and Characterization for HEP and Photon Science Experiment: How to Design Detectors by TCAD Simulation
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Condition: As New. Unread book in perfect condition.
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Si Detectors and Characterization for Hep and Photon Science Experiment : How to Design Detectors by Tcad Simulation
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New. pp. 183 1st ed. 2019 edition.
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Si Detectors and Characterization for Hep and Photon Science Experiment : How to Design Detectors by Tcad Simulation
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Si Detectors and Characterization for HEP and Photon Science Experiment | How to Design Detectors by TCAD Simulation
Published by Springer International Publishing, 2020
ISBN 10: 3030195333 ISBN 13: 9783030195335
Language: English
Taschenbuch. Condition: Neu. Si Detectors and Characterization for HEP and Photon Science Experiment | How to Design Detectors by TCAD Simulation | Ajay Kumar Srivastava | Taschenbuch | xvii | Englisch | 2020 | Springer International Publishing | EAN 9783030195335 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Si Detectors and Characterization for HEP and Photon Science Experiment
Published by Springer International Publishing, Springer International Publishing Sep 2020, 2020
ISBN 10: 3030195333 ISBN 13: 9783030195335
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Neuware -This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master¿s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 204 pp. Englisch.
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Si Detectors and Characterization for HEP and Photon Science Experiment : How to Design Detectors by TCAD Simulation
Published by Springer International Publishing, 2020
ISBN 10: 3030195333 ISBN 13: 9783030195335
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master's level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.
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Hardcover. Condition: Brand New. 204 pages. 9.25x6.10x0.71 inches. In Stock.
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Si Detectors and Characterization for HEP and Photon Science Experiment
Published by Springer International Publishing, Springer International Publishing Sep 2019, 2019
ISBN 10: 3030195309 ISBN 13: 9783030195304
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware -This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master¿s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 204 pp. Englisch.
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Si Detectors and Characterization for HEP and Photon Science Experiment : How to Design Detectors by TCAD Simulation
Published by Springer International Publishing, 2019
ISBN 10: 3030195309 ISBN 13: 9783030195304
Language: English
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master's level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.
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Paperback. Condition: New. New. book.
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Hardcover. Condition: New. New. book.
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Si Detectors and Characterization for HEP and Photon Science Experiment
Published by Springer International Publishing Sep 2020, 2020
ISBN 10: 3030195333 ISBN 13: 9783030195335
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master's level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. 204 pp. Englisch.
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Condition: New. Print on Demand pp. XVII, 183 106 illus., 77 illus. in color.
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Si Detectors and Characterization for HEP and Photon Science Experiment
Published by Springer International Publishing Sep 2019, 2019
ISBN 10: 3030195309 ISBN 13: 9783030195304
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master's level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. 204 pp. Englisch.
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Si Detectors and Characterization for HEP and Photon Science Experiment
Published by Springer International Publishing, 2020
ISBN 10: 3030195333 ISBN 13: 9783030195335
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Discusses the physics and technology of the Si detector and its performance in the CMS experiment at LHC by the collaboration of radiation hard semiconductor devices for very high luminosity colliders (RD50)Introduces the experiments for ra.
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Condition: New. PRINT ON DEMAND pp. XVII, 183 106 illus., 77 illus. in color.
-
Si Detectors and Characterization for HEP and Photon Science Experiment
Published by Springer International Publishing, 2019
ISBN 10: 3030195309 ISBN 13: 9783030195304
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Discusses the physics and technology of the Si detector and its performance in the CMS experiment at LHC by the collaboration of radiation hard semiconductor devices for very high luminosity colliders (RD50)Introduces the experiments for ra.
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Condition: New. Print on Demand pp. 183.
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Condition: New. PRINT ON DEMAND pp. 183.
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Si Detectors and Characterization for HEP and Photon Science Experiment | How to Design Detectors by TCAD Simulation
Published by Springer International Publishing, 2019
ISBN 10: 3030195309 ISBN 13: 9783030195304
Language: English
Buch. Condition: Neu. Si Detectors and Characterization for HEP and Photon Science Experiment | How to Design Detectors by TCAD Simulation | Ajay Kumar Srivastava | Buch | xvii | Englisch | 2019 | Springer International Publishing | EAN 9783030195304 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
