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Data Mining Diagnosing Fails by Huisman Leendert (30 results)
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Data Mining and Diagnosing IC Fails.
Book 15 of 40: Frontiers in Electronic TestingPublished by New York/ NY, Springer US., 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing). Sprache: Englisch.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Condition: As New. Unread book in perfect condition.
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Data Mining And Diagnosing Ic Fails
Book 15 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Data Mining and Diagnosing Ic Fails
Book 15 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Data Mining And Diagnosing Ic Fails
Book 15 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Book 15 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Book 15 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Hardcover. Condition: Brand New. 1st edition. 270 pages. 9.25x6.25x0.75 inches. In Stock.
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Taschenbuch. Condition: Neu. Data Mining and Diagnosing IC Fails | Leendert M Huisman | Taschenbuch | xx | Englisch | 2010 | Springer Us | EAN 9781441937674 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Data Mining and Diagnosing IC Fails
Book 15 of 40: Frontiers in Electronic TestingPublished by Springer US, Springer New York Jun 2005, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.
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Data Mining and Diagnosing IC Fails
Book 15 of 40: Frontiers in Electronic TestingPublished by Springer US, Springer New York, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Language: English
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
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Data Mining and Diagnosing Ic Fails
Book 15 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Paperback. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Data Mining and Diagnosing IC Fails
Book 15 of 40: Frontiers in Electronic TestingPublished by SPRINGER NATURE Dez 2010, 2010
ISBN 10: 1441937676 ISBN 13: 9781441937674
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done. 250 pp. Englisch.
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Data Mining and Diagnosing IC Fails
Book 15 of 40: Frontiers in Electronic TestingPublished by Springer US Jun 2005, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment. 272 pp. Englisch.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Makes various data mining and diagnostic techniques available in one place to professionalsThe techniques described in this book are not available in one place, and many are not even available in any bookPresents a new diagnosis technique S.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Makes various data mining and diagnostic techniques available in one place to professionalsThe techniques described in this book are not available in one place, and many are not even available in any bookPresents a new diagnosis technique S.
