Data Mining and Diagnosing IC Fails

Language: English

Published by Springer US, Springer New York Jun 2005, 2005

0387249931 / 9780387249933

Series: Book 15 of 40 - Frontiers in Electronic Testing

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This item is printed on demand - Print on Demand Titel. Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.…

Seller Inventory # 9780387249933

Title
Data Mining and Diagnosing IC Fails
Author
Leendert M. Huisman
Publisher
Springer US, Springer New York Jun 2005
Publication year
2005
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0387249931
ISBN 13
9780387249933
Item weight
576 grams
Dimensions
241x160x20 mm
Series
Book 15 of 40: Frontiers in Electronic Testing

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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AbeBooks seller since January 23, 2017

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