Compact Modeling Noise Behavior by Nae Bogdan (9 results)

Condition: New. pp. 256.

Taschenbuch. Condition: Neu. Compact Modeling of the RF and Noise Behavior of Multiple-Gate MOSFETs | Bogdan Mihai Nae (u. a.) | Taschenbuch | 256 S. | Englisch | 2013 | LAP LAMBERT Academic Publishing | EAN 9783843304726 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The nanoelectronics world is moving forward at incredible speed, and technology keeps improving overnight. One can no longer afford to spend months or even years evaluating a future technological node, thus the need for a robust evaluation system has arisen. Numerical ways of modeling the new device architectures, apart from precision, offer very little in terms of performance, and are being replaced by new analytical tools, focus on providing exactly that - speed and accuracy. This work has been conceived to cover precisely these aspects. The models described here are physical models, with very few adjustment parameters, that are usually replaceable with values extracted from experimental measurements. They have the advantage of being easily incorporated into circuit simulators, which allow designers to unleash the full capabilities of the design software to create new devices and applications. 256 pp. Englisch. …

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Nae Bogdan MihaiBogdan Mihai Nae was born in Romania in 1980. He received the M.S. and Ph.D. degrees in Microelectronics from Universitat Rovira i Virgili (URV), Tarragona, Spain, in 2007 and 2011 respectively. His research interests. …

Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The nanoelectronics world is moving forward at incredible speed, and technology keeps improving overnight. One can no longer afford to spend months or even years evaluating a future technological node, thus the need for a robust evaluation system has arisen. Numerical ways of modeling the new device architectures, apart from precision, offer very little in terms of performance, and are being replaced by new analytical tools, focus on providing exactly that - speed and accuracy. This work has been conceived to cover precisely these aspects. The models described here are physical models, with very few adjustment parameters, that are usually replaceable with values extracted from experimental measurements. They have the advantage of being easily incorporated into circuit simulators, which allow designers to unleash the full capabilities of the design software to create new devices and applications.…

Condition: New. Print on Demand pp. 256 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The nanoelectronics world is moving forward at incredible speed, and technology keeps improving overnight. One can no longer afford to spend months or even years evaluating a future technological node, thus the need for a robust evaluation system has arisen. Numerical ways of modeling the new device architectures, apart from precision, offer very little in terms of performance, and are being replaced by new analytical tools, focus on providing exactly that - speed and accuracy. This work has been conceived to cover precisely these aspects. The models described here are physical models, with very few adjustment parameters, that are usually replaceable with values extracted from experimental measurements. They have the advantage of being easily incorporated into circuit simulators, which allow designers to unleash the full capabilities of the design software to create new devices and applications.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 256 pp. Englisch.…

Condition: New. PRINT ON DEMAND pp. 256.