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Built in Self Test Digital Self Calibration Socs by Bou Sleiman Sleiman (7 results)
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£ 33.14
Convert currency£ 7.57 shipping from Germany to United KingdomQuantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Seiten: 108 | Sprache: Englisch | Produktart: Bücher.
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PF. Condition: New.
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 54.72
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Add to basketCondition: New. In.
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£ 51.57
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£ 44.87
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£ 42.38
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Add to basketKartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Applies Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the out.
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Published by Springer-Verlag New York Inc., 2011
ISBN 10: 1441995471 ISBN 13: 9781441995476
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 63.87
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 194.
