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Built-in-Self-Test and Digital Self-Calibration for RF SoCs: 0 (SpringerBriefs in Electrical and Computer Engineering) - Softcover
Synopsis
This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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- PublisherSpringer
- Publication date2011
- ISBN 10 1441995471
- ISBN 13 9781441995476
- BindingPaperback
- LanguageEnglish
- Number of pages106
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
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Springer New York Sep 2011, 2011
ISBN 10: 1441995471
ISBN 13: 9781441995476
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 108 pp. Englisch. Seller Inventory # 9781441995476
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering)
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Published by
Springer New York, Springer US, 2011
ISBN 10: 1441995471
ISBN 13: 9781441995476
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. Seller Inventory # 9781441995476
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Applies Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the out. Seller Inventory # 4176716
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Published by
Springer New York, Springer US Sep 2011, 2011
ISBN 10: 1441995471
ISBN 13: 9781441995476
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Taschenbuch. Condition: Neu. Neuware -This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 108 pp. Englisch. Seller Inventory # 9781441995476
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering)
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