Analytical Electron Microscopy Materials by Shindo Daisuke (9 results)

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  • Language: English

    Published by Springer 9/20/2002, 2002

    4431703365 / 9784431703365

    • Softcover

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    Paperback or Softback. Condition: New. Analytical Electron Microscopy for Materials Science. Book.

  • Language: English

    Published by Springer, 2002

    4431703365 / 9784431703365

    • Softcover

    Seller: California Books, Miami, FL, U.S.A.California Books

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  • Language: English

    Published by Springer, 2002

    4431703365 / 9784431703365

    • Softcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2002

    4431703365 / 9784431703365

    • Softcover
    • First Edition

    Seller: Corner of a Foreign Field, Tokyo, TOKYO, JapanCorner of a Foreign Field

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    Soft cover. Condition: Very Good. No Jacket. 1st Edition. 2002.Softcover.Very good condition.152 pages.Ships from Japan.Usually ships in 1-2 working days.

  • Language: English

    Published by Springer, 2002

    4431703365 / 9784431703365

    • Softcover

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.…

  • Language: English

    Published by Springer Nature B.V., 2012

    4431669892 / 9784431669890

    • Softcover
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    PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

  • Language: English

    Published by Springer Nature B.V., 2012

    4431669892 / 9784431669890

    • Softcover
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    PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

  • Language: English

    Published by Springer Japan, 2002

    4431703365 / 9784431703365

    • Softcover
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    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Detailed explanation of the basic principles and the latest improvements in analytical electron microscopyGenerous illustrations and experimental dataAnalytical electron microscopy is one of the most powerful tools today for characterization of the .…

  • Language: English

    Published by Springer, Springer Sep 2002, 2002

    4431703365 / 9784431703365

    • Softcover
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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 168 pp. Englisch.…